Patents Assigned to Kitov Systems Ltd
  • Patent number: 12347090
    Abstract: Systems and methods are disclosed for automated inspection and part enrollment. In one implementation, a selection of an area of a part is received within a graphical user interface depicting a representation of the part. Based on the selection of the area of the part, a location of the selected area is determined. Image capture parameter(s) are determined based on the determined location. Based on (a) the determined image capture parameters and (b) the location of the selected area, an inspection path is computed with respect to the part. The computed inspection path is executed with respect to the part via an inspection system.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: July 1, 2025
    Assignee: Kitov Systems Ltd
    Inventors: Nir Avrahami, Joseph Rubner, Kfir Gedalyahu, Eran Vered, Liran Tzafri
  • Publication number: 20240414439
    Abstract: A method of inspecting an object of manufacture, the method including: receiving: a model of the object of manufacture, the model including one or more feature of a region of interest (ROI) of the object of manufacture; and inspection requirements including a specification of required quality of image data of the ROI; moving an imager with respect to the object of manufacture, while acquiring at least one image of the ROI using the imager, wherein the moving is controlled so that the at least one image provides the required quality of image data of the ROI; extracting one or more feature of the ROI, from the at least one image; and comparing the one or more feature of the ROI with a corresponding one or more feature of the model.
    Type: Application
    Filed: October 3, 2022
    Publication date: December 12, 2024
    Applicant: Kitov Systems Ltd
    Inventors: Yigal KATZIR, Gilad FURST, Nir AVRAHAMI, Tamir MARGALIT
  • Publication number: 20240386541
    Abstract: Image outputs of visual inspection resources are integrated into a visual inspection plan for a manufactured item. Imaging requirements are accessed, derived from visual inspection requirements for the manufactured item. Also accessed are imaging parameters specifying configurations of respective visual inspection resources used to generate visual inspection images of the manufactured item. Correspondences between imaging requirements and imaging parameters and/or images are determined. From these correspondences, fulfilment of the inspection requirements is determined. Tasks such as inspection planning, reporting, and/or modification of configurations of visual inspection resources are optionally carried out, based on the fulfilment determinations.
    Type: Application
    Filed: September 23, 2022
    Publication date: November 21, 2024
    Applicant: Kitov Systems Ltd
    Inventor: Joseph RUBNER
  • Publication number: 20230410364
    Abstract: Automatic enrollment of an item of manufacture to a quality inspection system comprises using associations of enrollment images of an example of the item of manufacture to their corresponding camera poses. Enrollment images which show inspection targets (e.g., components of the item of manufacture) in views which are also suitable for use in visual inspection of further instances of the item of manufacture are identified. Their associated camera poses are selected and provided for use in inspection planning. In some embodiments, suitability of the camera pose is verified by performing inspection tests on the enrollment images.
    Type: Application
    Filed: September 29, 2021
    Publication date: December 21, 2023
    Applicant: Kitov Systems Ltd
    Inventors: Ziv TSOREF, Nir AVRAHAMI, Tomer SHMUL
  • Publication number: 20230297092
    Abstract: Assembly-level properties defined by a manufactured product’s assembly tree analyzed as trigger predicates to assist identification (i.e., selection and/or preparation) of inspection requirements for the manufactured product. Particular emphasis is placed on hierarchical relationships-assembly identification, effects of manufacturing on the visibility/accessibility of an assembly to inspection, and using assembly-level semantics to trigger inspection requirements. The identified inspection requirements are optionally open (semantic) or closed. In some embodiments, identified inspection requirements are provided to an automatic inspection planning system configured to generate an inspection plan, the actions of which said plan fulfill the inspection requirements.
    Type: Application
    Filed: August 5, 2021
    Publication date: September 21, 2023
    Applicant: Kitov Systems Ltd
    Inventor: Joseph RUBNER
  • Publication number: 20210166364
    Abstract: Systems, methods, and related technologies for automated inspection are described. In certain aspects, one or more images of a reference part can be captured and the one or more images of the reference part can be processed to generate an inspection model of the reference part. One or more regions of the inspection model can be associated with one or more analysis parameters. An inspection plan can be generated based on the inspection model and the one or more analysis parameters. Based on the inspection plan, one or more images of a part to be inspected can be captured and the one or more images of the part can be processed in relation to the analysis parameters to compute one or more determinations with respect to the part. One or more outputs can be providing based on the one or more determinations.
    Type: Application
    Filed: February 8, 2021
    Publication date: June 3, 2021
    Applicant: Kitov Systems Ltd
    Inventors: Nir AVRAHAMI, Joseph RUBNER
  • Patent number: 10916005
    Abstract: Systems, methods, and related technologies for automated inspection are described. In certain aspects, one or more images of a reference part can be captured and the one or more images of the reference part can be processed to generate an inspection model of the reference part. One or more regions of the inspection model can be associated with one or more analysis parameters. An inspection plan can be generated based on the inspection model and the one or more analysis parameters. Based on the inspection plan, one or more images of a part to be inspected can be captured and the one or more images of the part can be processed in relation to the analysis parameters to compute one or more determinations with respect to the part. One or more outputs can be providing based on the one or more determinations.
    Type: Grant
    Filed: November 24, 2015
    Date of Patent: February 9, 2021
    Assignee: Kitov Systems Ltd
    Inventors: Nir Avrahami, Joseph Rubner