Patents Assigned to Kiyota Manufacturing Co.
  • Publication number: 20110247209
    Abstract: [Problem] To provide a contact probe which can easily be connected with a measurement apparatus electrically, can measure a high speed and high frequency signal with a fine pitch easily and correctly, and can easily cope with signal measurement for a plurality of channels, and a method of making the contact probe. [Means to Solve Problem] It includes a first printed wiring board 3 having a signal electrode 10a and a ground electrode 10b used as a contact part with respect to a measuring object, in which the signal electrode 10a and ground electrode 10b are formed of a metal wiring pattern on a substrate, and a second printed wiring board 2 with a coaxial line structure having shield electrodes 12, 17, 18 which enclose a signal line 15a and the surroundings of the signal line 15a through an insulating layer.
    Type: Application
    Filed: June 24, 2011
    Publication date: October 13, 2011
    Applicants: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, KIYOTA MANUFACTURING CO., TSS CORPORATION
    Inventors: Masahiro Aoyagi, Katsuya Kikuchi, Hiroshi Nakagawa, Yoshikuni Okada, Hiroyuki Fujita, Shouichi Imai, Shigeo Kiyota
  • Publication number: 20090224781
    Abstract: [Problem]To provide a contact probe which can easily be connected with a measurement apparatus electrically, can measure a high speed and high frequency signal with a fine pitch easily and correctly, and can easily cope with signal measurement for a plurality of channels, and a method of making the contact probe. [Means to Solve Problem] It includes a first printed wiring board 3 having a signal electrode 10a and a ground electrode 10b used as a contact part with respect to a measuring object, in which the signal electrode 10a and ground electrode 10b are formed of a metal wiring pattern on a substrate, and a second printed wiring board 2 with a coaxial line structure having shield electrodes 12, 17, 18 which enclose a signal line 15a and the surroundings of the signal line 15a through an insulating layer.
    Type: Application
    Filed: April 19, 2007
    Publication date: September 10, 2009
    Applicants: SHINWA FRONTECH CORP., KIYOTA MANUFACTURING CO.
    Inventors: Masahiro Aoyagi, Katsuya Kikuchi, Hiroshi Nakagawa, Yoshikuni Okada, Hiroyuki Fujita, Shouichi Imai, Shigeo Kiyota
  • Patent number: 7227352
    Abstract: There is provided a contact probe that is smaller than 50 ?m in a pitch between a signal electrode and a ground electrode and can correctly conduct a high-speed high-frequency measurement, a measuring pad used for the contact probe, and a method of manufacturing the contact probe. The contact probe includes: a tip member having a signal electrode 10a and a ground electrode 11a that are put into contact with an object to be measured; and a coaxial cable 1 having a core 1b electrically connected to the signal electrode 10a and an outer covering conductor la electrically connected to the ground electrode 11a, wherein the tip member is formed on a printed wiring board 2, and wherein the signal electrode 10a and the ground electrode 11a are constructed of fine coplanar strip lines formed on an insulating board 2a.
    Type: Grant
    Filed: November 21, 2006
    Date of Patent: June 5, 2007
    Assignees: National Institute of Advanced Industrial Science and Technology, Kiyota Manufacturing Co.
    Inventors: Masahiro Aoyagi, Hiroshi Nakagawa, Kazuhiko Tokoro, Katsuya Kikuchi, Yoshikuni Okada, Shigeo Kiyota
  • Patent number: 7208966
    Abstract: There is provided a contact probe that is smaller than 50 ?m in a pitch between a signal electrode and a ground electrode and can correctly conduct a high-speed high-frequency measurement, a measuring pad used for the contact probe, and a method of manufacturing the contact probe. The contact probe includes: a tip member having a signal electrode 10a and a ground electrode 11a that are put into contact with an object to be measured; and a coaxial cable 1 having a core 1b electrically connected to the signal electrode 10a and an outer covering conductor 1a electrically connected to the ground electrode 1a, wherein the tip member is formed on a printed wiring board 2, and wherein the signal electrode 10a and the ground electrode 11a are constructed of fine coplanar strip lines formed on an insulating board 2a.
    Type: Grant
    Filed: May 25, 2005
    Date of Patent: April 24, 2007
    Assignees: National Institute of Advanced Industrial Science and Technology, Kiyota Manufacturing Co.
    Inventors: Masahiro Aoyagi, Hiroshi Nakagawa, Kazuhiko Tokoro, Katsuya Kikuchi, Yoshikuni Okada, Shigeo Kiyota
  • Publication number: 20070065956
    Abstract: There is provided a contact probe that is smaller than 50 ?m in a pitch between a signal electrode and a ground electrode and can correctly conduct a high-speed high-frequency measurement, a measuring pad used for the contact probe, and a method of manufacturing the contact probe. The contact probe includes: a tip member having a signal electrode 10a and a ground electrode 11a that are put into contact with an object to be measured; and a coaxial cable 1 having a core 1b electrically connected to the signal electrode 10a and an outer covering conductor la electrically connected to the ground electrode 11a, wherein the tip member is formed on a printed wiring board 2, and wherein the signal electrode 10a and the ground electrode 11a are constructed of fine coplanar strip lines formed on an insulating board 2a.
    Type: Application
    Filed: November 21, 2006
    Publication date: March 22, 2007
    Applicants: NAT'L INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, KIYOTA MANUFACTURING CO.
    Inventors: Masahiro Aoyagi, Hiroshi Nakagawa, Kazuhiko Tokoro, Katsuya Kikuchi, Yoshikuni Okada, Shigeo Kiyota
  • Publication number: 20050264313
    Abstract: There is provided a contact probe that is smaller than 50 ?m in a pitch between a signal electrode and a ground electrode and can correctly conduct a high-speed high-frequency measurement, a measuring pad used for the contact probe, and a method of manufacturing the contact probe. The contact probe includes: a tip member having a signal electrode 10a and a ground electrode 11a that are put into contact with an object to be measured; and a coaxial cable 1 having a core 1b electrically connected to the signal electrode 10a and an outer covering conductor 1a electrically connected to the ground electrode 1a, wherein the tip member is formed on a printed wiring board 2, and wherein the signal electrode 10a and the ground electrode 11a are constructed of fine coplanar strip lines formed on an insulating board 2a.
    Type: Application
    Filed: May 25, 2005
    Publication date: December 1, 2005
    Applicants: National Institute of Advanced Industrial Science and Technology, KIYOTA MANUFACTURING CO.
    Inventors: Masahiro Aoyagi, Hiroshi Nakagawa, Kazuhiko Tokoro, Katsuya Kikuchi, Yoshikuni Okada, Shigeo Kiyota