Patents Assigned to KONICA MINOLTA OPTICS, INC.
  • Patent number: 8982349
    Abstract: In a measuring probe (40) according to the present invention, measuring light is split into a two or more through a split optical system (12), and, when each split light is received by a light-receiving sensor (13B, 13B, 15B) through an interference filter (13A, 14A, 15A) serving as a color filter, the split light is introduced into the interference filter (13A, 14A, 15A) through a collecting lens group (123C, 14C, 15C) formed as a substantially bilateral telecentric system. The interference filter (13A, 14A, 15A) is formed to obtain a transmittance characteristic corresponding to a measurement parameter, depending on a condition of an intensity distribution with respect to incidents angles of light incident on the interference filter (13A, 14A, 15A). Thus, the measuring probe (40) according to the present invention can reduce an influence of a deviation in the transmittance characteristic due to incident angles, even using the interference filter (13A, 14A, 15A).
    Type: Grant
    Filed: March 8, 2011
    Date of Patent: March 17, 2015
    Assignee: Konica Minolta Optics, Inc.
    Inventor: Katsutoshi Tsurutani
  • Patent number: 8797659
    Abstract: A macro lens and an imaging apparatus include, in the order from an object side to an image side, a first lens group, a second lens group, and a third lens group. Focusing is performed by fixing the first lens group and the third lens group, and by moving the second lens group having a positive refractive power as a whole on the optical axis in focusing from an infinite object to a close distance object. The first lens group has a plane S1 and a plane S2 of curvature radii of a same sign and satisfying a specified condition.
    Type: Grant
    Filed: April 11, 2013
    Date of Patent: August 5, 2014
    Assignee: Konica Minolta Optics, Inc.
    Inventor: Yoshihito Souma
  • Patent number: 8729919
    Abstract: With a light source evaluation device 10 according to the present invention and a solar cell evaluation device 1 employing the same, a dependency P (?, Ib) for each wavelength ? of a short-circuit current Ib generated by white bias light of a measurement target solar cell 2, which is pre-measured at each of a plurality (i) of irradiance levels, is regarded as a spectral responsivity Pi (?) at each irradiance level, and a value for adjusting a light quantity of an illumination light source 3 that illuminates the solar cell 2 is computed using a spectral responsivity Ps (?), which is computed using the spectral responsivity Pi (?), a pre-supplied spectral irradiance S (?) of reference sunlight, and a pre-measured spectral irradiance L (?) of the illumination light source 3.
    Type: Grant
    Filed: July 15, 2011
    Date of Patent: May 20, 2014
    Assignee: Konica Minolta Optics, Inc.
    Inventors: Yoshihiro Nishikawa, Tsutomu Okura
  • Patent number: 8704937
    Abstract: An imaging optical system, an imaging device, and a digital apparatus have a four lens construction with positive, negative, positive, and negative refractive powers. A surface position at the maximum effective diameter of the second lens element is located on the object side than a surface vertex thereof. The fourth lens element has an inflection point at a position other than the intersection of the optical axis and the fourth lens element. The optical system satisfies the following conditions. 0.7<f1/f<5 ?0.8<(RS1+RS2)/(RS1?RS2)<3 ?3<(RS3+RS4)/(RS3?RS4)<2 0.03<d2/TL<0.2 2W>72 ?4>50, and 0.55<Y/TL<0.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: April 22, 2014
    Assignee: Konica Minolta Optics, Inc.
    Inventors: Keiji Matsusaka, Hiroaki Tanaka
  • Publication number: 20130006556
    Abstract: The provided solar simulator light-intensity evaluation apparatus and method can evaluate the characteristics of a solar cell in an arbitrary place at an arbitrary time and date, using an existing solar simulator, as follows: an estimated spectral irradiance of the natural sunlight is calculated under a measurement condition including a place and/or a time and date where and when the solar cell is measured; and an target value of adjustment and estimated light amount value of the solar simulator are calculated under the measurement condition, on the basis of the estimated spectral irradiance having been calculated, the spectral irradiance of the solar simulator, and solar cell information including a spectral sensitivity of the solar cell.
    Type: Application
    Filed: February 18, 2011
    Publication date: January 3, 2013
    Applicant: KONICA MINOLTA OPTICS, INC.
    Inventor: Yoshihiro Nishikawa