Patents Assigned to Korea Research Institute of Standards and Science
  • Publication number: 20230229829
    Abstract: A method of designing a frequency selective surface (FSS) filter, includes: calculating a candidate solution corresponding to a structure of the FSS filter and an objective-function value corresponding to a difference between a frequency response resulting from the candidate solution and a targeted frequency response; modifying the candidate solution into a trial solution in accordance with a genetic algorithm; and calculating an objective-function value with the trial solution to determine whether to include the trial solution in candidate solutions.
    Type: Application
    Filed: May 11, 2021
    Publication date: July 20, 2023
    Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Young Pyo HONG, In Ho LEE, In June HWANG, Dal Jae YUN
  • Patent number: 11662229
    Abstract: The present invention relates to an optical fiber BOCDA sensor. A purpose of the present invention is to provide an optical fiber BOCDA sensor which uses two phase codes to control a correlation peak position, thereby further simplifying control design and device configuration and improving spatial resolution to enhance a sensing performance and detection accuracy in comparison with the prior art.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: May 30, 2023
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Il-Bum Kwon, Dae-Cheol Seo, Chi-Yeop Kim, Bo-Hun Choi
  • Patent number: 11592441
    Abstract: Provided is a nanoplasmonic sensor and a kit for biomolecule analysis, and a method of analyzing a biomolecule using the same. The method includes: providing the nanoplasmonic sensor including a dielectric grating extending in one direction, and a metal structure disposed to cover an upper surface and a side surface of the dielectric grating and have at least one bent portion; immobilizing a first probe molecule on a surface of the metal structure; hybridizing an analyte with the first probe molecule by introducing the analyte having a base sequence complementary to the first probe molecule; binding a second probe molecule that is hybridized with the first probe molecule to the analyte; binding an enzyme to the second probe molecule; introducing a substrate that reacts with the enzyme to produce a precipitate by an enzymatic reaction; and measuring localized surface plasmon resonance in the metal structure.
    Type: Grant
    Filed: December 11, 2018
    Date of Patent: February 28, 2023
    Assignees: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE, FOUNDATION FOR RESEARCH AND BUSINESS, SEOUL NATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY
    Inventors: Tae Geol Lee, Hee Kyung Na, Jung Sub Wi, Jong G. OK
  • Patent number: 11493433
    Abstract: The present invention relates to a normal incidence ellipsometer and a method for measuring the optical properties of a sample by using same. The purpose of the present invention is to provide: a normal incidence ellipsometer in which a wavelength-dependent compensator is replaced with a wavelength-independent linear polarizer such that equipment calibration procedures are simplified while a measurement wavelength range expansion can be easily implemented; and a method for measuring the optical properties of a sample by using same.
    Type: Grant
    Filed: July 3, 2019
    Date of Patent: November 8, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Yong Jai Cho, Won Chegal, Hyun Mo Cho
  • Patent number: 11486700
    Abstract: The present disclosure is related to a system and a method for 3D shape measurement of a freeform surface based on high-speed deflectometry using composite patterns. More particularly, a system for profile measurement based on high-speed deflectometry using composite patterns includes: a composite pattern generation part to project a composite pattern generated by synthesizing patterns having different frequencies to a measurement object; a detector to acquire images of a deformed composite pattern reflected from the measurement object; and a phase acquisition part to acquire wrapped phases by each frequency from the composite pattern and unwrapped phases from the respective wrapped phases.
    Type: Grant
    Filed: July 29, 2019
    Date of Patent: November 1, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Young-Sik Ghim, The Manh Nguyen, Hyug-Gyo Rhee
  • Patent number: 11479474
    Abstract: Provided is a method of preparing composite nanoparticles, which includes: a) preparing a metal nanocore having a nano-star shape from a first reaction solution in which a first metal precursor is mixed with a first buffer solution; b) fixing a Raman reporter in the metal nanocore; and c) forming a metal shell, which surrounds the nanocore in which the Raman reporter is fixed, from a second reaction solution in which the nanocore in which the Raman reporter is fixed, and a second metal precursor are mixed with a second buffer solution.
    Type: Grant
    Filed: October 23, 2018
    Date of Patent: October 25, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Eun-Ah You, Wansun Kim, Tae Geol Lee
  • Publication number: 20220326288
    Abstract: A method of measuring a specific absorption rate (SAR) of a hip joint implant using magnetic resonance imaging (MRI), includes: arranging the hip joint implant in a human lower body-shaped phantom; arranging an electric field sensor around the hip joint implant; providing radio frequency (RF) energy according to an MRI sequence to the human phantom; and calculating the SAR of the hip joint implant from strength of an electric field measured by the electric field sensor.
    Type: Application
    Filed: March 30, 2022
    Publication date: October 13, 2022
    Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventor: Youngseob SEO
  • Patent number: 11466978
    Abstract: The present invention relates to an apparatus and a method for measuring a thickness and a refractive index of a multilayer thin film using an angle-resolved spectral interference image according to polarization.
    Type: Grant
    Filed: July 29, 2019
    Date of Patent: October 11, 2022
    Assignee: Korea Research Institute of Standard and Science
    Inventors: Young-sik Ghim, Hyug-gyo Rhee
  • Patent number: 11437013
    Abstract: The present invention relates to an ultra-thin acoustic lens for subwavelength focusing in a megasonic range and a design method thereof. More particularly, the present invention relates to a super-oscillatory planar ultra-thin acoustic lens for subwavelength focusing in the megasonic range, which includes a plurality of concentric regions arranged in a concentric shape with reference to the center point, wherein the concentric regions include a plurality acoustic insulation region for insulating incident acoustic waves, and a plurality of transmission regions for transmitting acoustic waves, the acoustic insulation regions and the transmission regions being formed alternatively in a radial direction from the center point so as to focus incident acoustic wave energy onto a subwavelength region.
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: September 6, 2022
    Assignee: Korea Research Institute of Standard and Science
    Inventors: Jae-yub Hyun, Yong-tae Kim, Il Doh, Bong-young Ahn, Kyung-min Baik, Se-hwa Kim
  • Patent number: 11435226
    Abstract: Provided are an apparatus and method for measuring quantum efficiency of a detector using a single pulse laser. Quantum efficiency of the measurement target detector may be measured from 420 nm to 1600 nm having uncertainty of 2% to 4% (K=2) by comparing the reference detector and the measurement target detector significantly different in sensitivity using a single laser pulse as a spectral light source. Also, it is possible to directly compare the two detectors with a significant difference in sensitivity through a very simple setup that causes a portion of a laser pulse output from a light source part to be absorbed by the reference detector and the laser pulse reflected from the reference detector to be irradiated to the measurement target detector.
    Type: Grant
    Filed: May 3, 2019
    Date of Patent: September 6, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Kee-Suk Hong, Dong-Hoon Lee, Seongchong Park, Jisoo Hwang
  • Publication number: 20220242736
    Abstract: A large-area wrinkled graphene substrate capable of being manufactured in a large-area, and a method for manufacturing the same is provided. A method for manufacturing a wrinkled graphene substrate includes: i) providing a graphene unit; ii) inserting a carrier film and a graphene unit between a pair of rolls and rotating the pair of rolls in opposite directions to attach a carrier film on the graphene unit, iii) immersing the graphene unit in an etching solution to provide graphene, iv) between a pair of rolls, graphene and poly(4-styrene sulfonic acid)/polystyrene (PSS/PS) substrate attaching graphene onto the PSS/PS substrate, v) attaching an ethylene vinyl acetate/polyethylene terephthalate (EVA/PET) substrate to wrinkled graphene on PSS/PS substrate by inserting EVA/PET and WGr/PSS/PS stack between the rolls, viii) removing the PSS/PS substrate by immersing PET/EVA/WGr/PSS/PS stack in water, and ix) providing a wrinkled graphene substrate on the EVA/PET substrate.
    Type: Application
    Filed: January 27, 2022
    Publication date: August 4, 2022
    Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Prashant Narute, Seong-Gu Hong
  • Patent number: 11402321
    Abstract: The present chip relates to a high-sensitive biosensor chip using a high extinction coefficient marker and a dielectric substrate, a measurement system, and a measurement method and, more specifically, to an ellipsometry-based high-sensitive biosensor technology or a measurement method using same, the technology amplifying an elliptically polarized signal by a marker having a high extinction coefficient and a dielectric substrate. The marker and the substrate used in the present chip measure a Brewster's angle shift or an elliptical polarization measurement angle with respect to an ultra-low concentration biological material (e.g. antibody or DNA).
    Type: Grant
    Filed: August 20, 2019
    Date of Patent: August 2, 2022
    Assignee: KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
    Inventors: Hyun-mo Cho, Dong-hyung Kim, Yong-jai Cho, Won Chegal
  • Patent number: 11378665
    Abstract: A distance measuring apparatus includes an image sensor and an image sensor driver. The image sensor includes a photodiode, a first capacitor and a second capacitor, and a first transfer gate and a second transfer gate configured to transmit an output of the photodiode to the respective first and second capacitors. The image sensor driver is configured to complementarily drive the first transfer gate and the second transfer gate.
    Type: Grant
    Filed: August 9, 2017
    Date of Patent: July 5, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Jae-Wan Kim, Jae-Yong Lee, Jong-Ahn Kim, Jae-Heun Woo, Young Pyo Hong
  • Patent number: 11322288
    Abstract: A fluid-cooled electromagnet includes an upper housing, a lower housing vertically aligned with the upper housing, a plurality of pancake coils disposed between the upper housing and the lower housing to be spaced apart from each other and sequentially stacked to have a washer shape, and at least one spacer, disposed between the upper housing and the lower housing, accommodating the pancake coils at regular intervals.
    Type: Grant
    Filed: September 18, 2019
    Date of Patent: May 3, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Seong Min Hwang, Jeong Hyun Shim, Ingo Hilschenz, Seong-Joo Lee, Kiwoong Kim
  • Patent number: 11287369
    Abstract: A method is disclosed for increasing an intensity of a signal detected in a spectroscopy device using a vapor cell and a spectroscopy device using the same. An operation method of the spectroscopy device may include: causing a first light for exciting an atom trapped in a vapor cell in a first hyperfine ground state to a first excited state to be incident on the vapor cell; causing a second light for exciting an atom trapped in the vapor cell in a second hyperfine ground state to a second excited state to be incident on the vapor cell; causing a third light for exciting the atom in the second excited state to a third excited state to be incident on the vapor cell; and detecting fluorescence which is emitted while the atom in the third excited state returns to the ground state.
    Type: Grant
    Filed: November 24, 2020
    Date of Patent: March 29, 2022
    Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Taek Jeong, Han Seb Moon, Dai Hyuk Yu, Jae Hoon Lee, Hyun Gue Hong
  • Patent number: 11287549
    Abstract: The present invention relates to an apparatus for calibrating temperature and humidity of a radio-sonde to be adapted to the upper air environment using an upper air simulation chamber including: an isotemperature-isohumidity unit calibrating temperature and humidity measured via the radio-sonde; a sunlight generation unit coupled to the isotemperature-isohumidity unit and generating sunlight to be irradiated to the isotemperature-isohumidity unit; an air supply unit coupled to the isotemperature-isohumidity unit and controlling the pressure and temperature of atmospheric air, allowing supplying air to the isotemperature-isohumidity unit; a sonic nozzle coupled to the isotemperature-isohumidity unit and creating an air flow set at below a set pressure; and a vacuum pump coupled to the isotemperature-isohumidity unit and discharging air which penetrates the isotemperature-isohumidity unit.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: March 29, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Yong-Gyoo Kim, In-Seok Yang, Sang-Bong Woo, Byung-Il Choi, Sang-Wook Lee, Woong Kang, Youn-Kyun Oh, Sung-Hun Kim, Seong-Chong Park, Young-Hee Lee
  • Patent number: 11255662
    Abstract: The present disclosure is directed to a system and a method for compensating non-linear response characteristics in measuring the shape of an object using phase-shifting deflectomerty. More particularly, the present disclosure is directed to a method for compensating non-linear response characteristics in phase-shifting deflectometry including steps of: generating a pattern by a pattern generating portion and projecting the same to a measurement object; obtaining an image of a deformed pattern reflected from the measurement object by a detector; linearizing non-linear responses on the basis of a look up table considering non-linear response characteristics of the pattern generating portion and the detector by a compensation means; and compensating phase-shifting amounts generated due to non-linear response characteristics by the compensation means.
    Type: Grant
    Filed: August 14, 2018
    Date of Patent: February 22, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Young-sik Ghim, The-mahn Nguyen, Hyug-gyo Rhee
  • Patent number: 11243070
    Abstract: In the embodiment in association with the present disclosure, an apparatus and method for multilayer thin film thickness measurement using single-shot angle-resolved spectral reflectometry are provided which allow simultaneously obtaining the absolute reflectance and phase data of a measurement object over a broad wavelength range and wide incident angle according to various polarization states by a single-shot measurement.
    Type: Grant
    Filed: February 27, 2020
    Date of Patent: February 8, 2022
    Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Young-Sik Ghim, Hyug-gyo Rhee
  • Publication number: 20220003539
    Abstract: The present invention relates to an apparatus and a method for measuring a thickness and a refractive index of a multilayer thin film using an angle-resolved spectral interference image according to polarization.
    Type: Application
    Filed: July 29, 2019
    Publication date: January 6, 2022
    Applicant: Korea Research Institute of Standard and Science
    Inventors: Young-sik Ghim, Hyug-gyo Rhee
  • Patent number: 11215450
    Abstract: Disclosed is a method of calculating a thickness of an ultra-thin film having a nm-order thickness based on measuring a thickness of each of ultra-thin films having different thicknesses by using a first thickness measurement method with length-unit traceability and separately measuring the thickness of each of the ultra-thin films having different thicknesses by using a second thickness measurement method with offset traceability.
    Type: Grant
    Filed: October 29, 2020
    Date of Patent: January 4, 2022
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Kyung Joong Kim, Tae Gun Kim