Patents Assigned to Korea Research Institute of Standards of Science
  • Patent number: 10145785
    Abstract: Provided is an optical element rotation type Mueller-matrix ellipsometer for solving a problem of measurement accuracy and measurement precision occurring due to residual polarization of a light source, polarization dependence of a photo-detector, measurement values of Fourier coefficients of a high order term in dual optical element rotation type Mueller-matrix ellipsometers according to the related art capable of measuring some or all of components of a Mueller-matrix for any sample.
    Type: Grant
    Filed: May 13, 2014
    Date of Patent: December 4, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Yong Jai Cho, Won Chegal, Hyun Mo Cho
  • Patent number: 10128077
    Abstract: The present invention relates to an electron gun for facilitating position adjustment, and an electron microscope including the same, the electron gun improving a vacuum structure so as to easily move a filament block or an electron tip of an electron gun without having bellows for maintaining a vacuum when the center axis of the filament block or the electron tip of the electron gun is mechanically misaligned with the center axis of a anode and a focusing lens.
    Type: Grant
    Filed: January 6, 2016
    Date of Patent: November 13, 2018
    Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Bok Lae Cho, In Young Park
  • Patent number: 10121658
    Abstract: The present invention relates to a method of fabricating a black phosphorus thin film and a black phosphorus thin film thereof and, more particularly, to a method of fabricating a black phosphorus ultrathin film by forming the black phosphorous ultrathin film in a chamber by active oxygen and removing accompanying black phosphorus oxide film water. The black phosphorus ultrathin film has a surface that does not substantially have defects and is uniform in a large area, and has a surface roughness property of 1 nm or less, to represent a high application property to an optoelectronic device and a field effect transistor.
    Type: Grant
    Filed: March 24, 2016
    Date of Patent: November 6, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Hyuksang Kwon, Jeong Won Kim, Eun Seong Lee
  • Patent number: 10108092
    Abstract: Provided is a photolithography method, including: a) forming a photoresist layer satisfying D=m*(?/2n) (D is a thickness of the photoresist layer, n is a refractive index of the photoresist, ? is a wavelength of irradiated light at the time of exposure, and m is a natural number of 1 or more) on a substrate; and b) manufacturing a photoresist pattern having a ring shape by exposing the photoresist layer and developing the exposed photoresist layer using a photo mask including a transparent substrate and a plate-type metal dot contacting a light emitting surface of the transparent substrate.
    Type: Grant
    Filed: June 9, 2015
    Date of Patent: October 23, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventor: Eun-Ah You
  • Patent number: 10082468
    Abstract: The present invention relates to a method for evaluating a SERS sensor substrate, comprising the steps of: a) measuring, through a dark-field microscope, the color of nanoparticles positioned on the SERS sensor substrate; b) converting the measured color into a distance between the nanoparticles; c) acquiring the Raman signal intensity of the SERS sensor substrate; d) acquiring the standard Raman signal intensity of a standard SERS sensor substrate including the nanoparticles having the distance that is the same as the converted distance; and e) comparing the Raman signal intensity and the standard Raman signal intensity.
    Type: Grant
    Filed: April 27, 2017
    Date of Patent: September 25, 2018
    Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventor: Hyuksang Kwon
  • Patent number: 10060990
    Abstract: The present invention relates to a shield apparatus and a shield method for measuring a subtle magnetic field. More specifically, the present invention relates to a shield apparatus having a precise magnetic sensor therein, for shielding an external magnetic field in a subtle magnetic field measurement apparatus including a magnetic field generation apparatus for exciting a sample, the shield apparatus for measuring a subtle magnetic field, including: a shield wall provided with a high-conductivity metal layer of high conductivity being partitioned into a plurality of segments and having a high-frequency shield property and a closed high-permeability soft magnetic layer spaced apart from the high-conductivity metal layer by a predetermined distance, so as to seal a measurement space.
    Type: Grant
    Filed: March 8, 2013
    Date of Patent: August 28, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Ki Woong Kim, Yong Ho Lee, Kwon Kyu Yu, Seong-Joo Lee
  • Patent number: 10062799
    Abstract: Provided are a method of manufacturing a quantum-dot photoactive-layer including: alternately depositing an amorphous silicon compound layer and a silicon-rich compound layer containing conductive impurities and an excess of silicon based on a stoichiometric ratio on a silicon substrate to form a composite multi-layer; and heat treating the composite multi-layer to form a plurality of silicon quantum-dots in a matrix corresponding to a silicon compound, wherein an amorphous silicon layer containing the conductive impurities is formed at least one time instead of the silicon-rich compound layer, and a quantum-dot photoactive-layer manufactured using the method as described above.
    Type: Grant
    Filed: October 15, 2015
    Date of Patent: August 28, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Ansoon Kim, Kyung Joong Kim, Songwoung Hong
  • Publication number: 20180218874
    Abstract: The present invention relates to an electron gun for facilitating position adjustment, and an electron microscope including the same, the electron gun improving a vacuum structure so as to easily move a filament block or an electron tip of an electron gun without having bellows for maintaining a vacuum when the center axis of the filament block or the electron tip of the electron gun is mechanically misaligned with the center axis of a anode and a focusing lens.
    Type: Application
    Filed: January 6, 2016
    Publication date: August 2, 2018
    Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Bok Lae CHO, In Yong PARK
  • Patent number: 10028674
    Abstract: Provided are ultra-low-field nuclear-magnetic-resonance myocardial electrical activity detection method and an ultra-low-field nuclear-magnetic-resonance device. The ultra-low-field nuclear-magnetic-resonance device includes magnetic shielding room; a high-sensitivity magnetic field sensor disposed adjacent to a measurement target disposed inside the magnetic shielding room; and a bias magnetic field generating coil for providing an external measurement bias magnetic field, corresponding to a proton magnetic resonance frequency (nuclear magnetic resonance frequency) corresponding to a frequency of periodic myocardial activity of a lesion desired to be measured, to the measurement target. The high-sensitivity magnetic field sensor measures a magnetic resonance signal generated from the measurement target.
    Type: Grant
    Filed: May 10, 2013
    Date of Patent: July 24, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Kiwoong Kim, Yong-Ho Lee, Jin-Mok Kim, Hyukchan Kwon, Kwon Kyu Yu
  • Patent number: 10033307
    Abstract: Sample loading device and electrostatic levitation apparatus. The electrostatic levitation apparatus includes a sample storage part including a rod-shaped sample standby part having an external diameter of a first diameter and a rod-shaped sample loading part having an external diameter of a second diameter and a sample cover part covering the sample standby part. The sample storage part has a loading bar inserting hole formed in its center. The loading bar inserting hole is formed through the sample standby part and is formed successively through a portion of the sample loading part. The sample standby part has sample storage vertical through-holes. The sample loading part has a single sample transfer vertical through-hole. The sample transfer vertical through-hole is formed on a surface where the sample storage vertical through-hole is viewed, penetrates the sample loading part, and is connected to the loading bar inserting hole.
    Type: Grant
    Filed: August 31, 2015
    Date of Patent: July 24, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Geun-Woo Lee, Sangho Jeon, Dong-Hee Kang
  • Patent number: 10026495
    Abstract: A method of controlling a magnetization state using an imprinting technique may be provided. The method may include moving first and second magnetic structures, which have different magnetization states, toward each other and changing a magnetization state of the first or second magnetic structure, when a distance between the first and second magnetic structures is reduced. A magnetic field, which is produced by a magnetization state of one of the first and second magnetic structures, may be used to align a magnetization state of the other, when the magnetization state of the first or second magnetic structure is changed.
    Type: Grant
    Filed: May 26, 2017
    Date of Patent: July 17, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Kyoung Woong Moon, Chan Yong Hwang
  • Patent number: 10027426
    Abstract: According to one embodiment of the present invention, there is provided a photon generating apparatus including: a light source configured to emit light; an optical medium configured to generate a pair of photons from the light; a detector configured to detect one photon from the pair of photons and output a detection time of the photon; a buffer including an optical line and an optical switch disposed on an optical path of the photon, which is one photon except for the photon detected by the detector, of the pair of photons; and a processor configured to output a driving signal which controls the optical switch so that a delay occurs at the optical path using the detection time of the photon detected by the detector.
    Type: Grant
    Filed: September 21, 2017
    Date of Patent: July 17, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Hee Su Park, Eun Joo Lee, Hee Jung Lee, Sang Min Lee
  • Patent number: 10018603
    Abstract: Provided is a two-dimensional liquid chromatography system, and more particularly, a two-dimensional liquid chromatography system capable of performing both independent one-dimensional separation through a reversed-phase or normal-phase chromatography method and two-dimensional separation for removing a matrix effect in a single system.
    Type: Grant
    Filed: June 29, 2015
    Date of Patent: July 10, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Seok-Won Hyung, Byungjoo Kim
  • Publication number: 20180158645
    Abstract: A vacuum sample chamber for a particle and optical device includes on one surface thereof, an aperture through which a particle beam to be focused along an optical axis of particles such as electrons, ions and neutral particles is incident; and on the opposite surface thereof, a detachable sample holder through which light penetrates, thereby enabling a sample to be observed and analyzed by means of the particle beam and light. A sample chamber is capable of reducing observation time by maintaining a vacuum therein even when a sample is put into or taken out from a sample chamber of an electron microscope or focused ion beam observation equipment, and capable of obtaining an optical image on the outside thereof without inserting a light source or an optical barrel into the sample chamber. A light-electron fusion microscope comprising the sample chamber.
    Type: Application
    Filed: August 11, 2016
    Publication date: June 7, 2018
    Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Bok Lae CHO, Sang Jung AHN, Inho SUL
  • Patent number: 9989503
    Abstract: Provided is an apparatus for quantitatively analyzing one or more gas components contained in a gas sample. More particularly, an apparatus for quantitatively analyzing gas components with an automatic feed control function of a gas, includes a multi-position valve, a pump, and a control part controlling the multi-position valve and the pump, such that the apparatus for quantitatively analyzing gas components may allow a professional worker performing analysis to secure an efficient research time while ensuring accuracy at the level equivalent to analysis results by a highly skilled professional worker regardless of proficiency of a newly employed person being in charge of quantitative analysis of the gas components of the gas sample in a sample bag.
    Type: Grant
    Filed: March 24, 2016
    Date of Patent: June 5, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventor: Namgoo Kang
  • Patent number: 9972414
    Abstract: Provided is a method of preparing a thin film structure having anisotropic, transparent, electroconductive, flexible properties. The method of preparing a thin film structure includes providing a growth substrate; growing silver nanolines on the growth substrate by using a lightning-rod effect; molding the silver nanolines by using a polymer; and separating the silver nanolines molded by the polymer from the growth substrate to form a freestanding anisotropic, transparent, electroconductive, and flexible thin film.
    Type: Grant
    Filed: November 26, 2013
    Date of Patent: May 15, 2018
    Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Jae Yong Song, Sun Hwa Park, Hyun Min Park
  • Patent number: 9965077
    Abstract: The present disclosure relates to a force sensor including a first substrate, a first electrode installed in a pattern on an upper surface of the first substrate, a second substrate disposed above and spaced apart from the first substrate, a second electrode installed in a pattern on a lower surface of the second substrate, facing the first electrode, and a dielectric interposed between the first substrate and the second substrate, wherein the dielectric includes a first dielectric surrounding an outside of the second electrode, and a pressure rib connecting the first dielectric to the first electrode, and a method for preparing the same, and shows a remarkably superior effect to related art, in terms of capacitance, interactivity and durability.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: May 8, 2018
    Assignees: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY, KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Heesuk Kim, Jong Ho Kim, Sang-Soo Lee, Yon Kyu Park, Min-Seok Kim
  • Publication number: 20180114672
    Abstract: The present invention relates to a charged particle beam apparatus enabling a selection of a charged particle beam in a specified energy range by symmetrically arranging cylindrical electrostatic lenses deflecting a path of the charged particle beam and disposing an energy selection aperture between the cylindrical electrostatic lenses. Since an integral structure in which a central electrode and a plurality of electrodes that are arranged at a front portion and a rear portion in relation to the central electrode of a monochromator are fixed to each other through insulator, is applied, a mechanism for adjusting an offset with respect to an optical axis is simplified as compared to the case of separately providing the lenses at the front portion and the rear portion, respectively, and a secondary aberration is canceled in an exit plane due to symmetry of an optical system.
    Type: Application
    Filed: March 24, 2016
    Publication date: April 26, 2018
    Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Takashi OGAWA, Ju Hwang KIM, In Yong PARK
  • Patent number: 9952093
    Abstract: An ultraviolet index measuring method and apparatus includes preparing a first photosensor having spectral response only in a first section of a wavelength between 250 nm and 298 nm, a second photosensor having spectral response only in a second section of a wavelength between 298 nm and 328 nm, and a third photosensor having spectral response only in a third section of a wavelength between 328 nm and 400 nm. An output signal of the first photosensor, an output signal of the second photosensor, and an output signal of the third photosensor are calibrated using spectral irradiance of reference solar light. First photocurrent of the first photosensor, second photocurrent of the second photosensor, and third photocurrent of the third photosensor are measured under a measurement environment. An ultraviolet index is calculated using the first photocurrent, the second photocurrent, and the third photocurrent under the measurement environment.
    Type: Grant
    Filed: January 27, 2016
    Date of Patent: April 24, 2018
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Dong-Hoon Lee, Seongchong Park, Dong-Joo Shin
  • Publication number: 20180105930
    Abstract: The present invention relates to a method for preparing a two-dimensional transition metal dichalcogenide and, more particularly, to a method for preparing a highly uniform two-dimensional transition metal dichalcogenide thin film. More specifically, the present invention is directed to a preparation method for a highly uniform two-dimensional transition metal dichalcogenide thin film at low temperature of 500° C. or below.
    Type: Application
    Filed: July 28, 2016
    Publication date: April 19, 2018
    Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
    Inventors: Sang Woo KANG, Ji Hun MUN