Patents Assigned to Kosaka Laboratory Ltd.
  • Patent number: 8468869
    Abstract: A method of calibrating a group of parameters of an articulated coordinate measuring apparatus includes the use of primary and secondary standard units. These standard units each include one or more calibration reference portions, and the group of parameters include primary and secondary calibration parameters. Space coordinates of each reference portion of the primary standard unit is measured at a plurality of arm positions of the apparatus, and calibration is performed for the primary calibration parameters based on the measurements. Space coordinates of the reference portions of secondary standard unit is then measured and parameter calibration is performed for the secondary calibration parameters based on these measurements.
    Type: Grant
    Filed: May 26, 2008
    Date of Patent: June 25, 2013
    Assignee: Kosaka Laboratory Ltd.
    Inventor: Fumikazu Ebara
  • Patent number: 7051447
    Abstract: Methods and systems for realizing accurate coordinate measurement using a multi-joint measuring arm. A system includes a support member, a multi-joint measuring arm having a first end attached to the support member and a second end at which a probe can be installed, and a processor configured to produce a three-dimensional coordinate corresponding to a position of the probe based on an angle of each joint of the measuring arm. A parameter concerning a posture of the measuring arm is detected exceeding a prescribed value, and a user is warned in accordance with a result of the detection. The prescribed value has been determined, for example, in accordance with a probability that a measurement error due to a user action pulling the measuring arm away from the support member becomes out of an allowable range.
    Type: Grant
    Filed: February 26, 2004
    Date of Patent: May 30, 2006
    Assignee: Kosaka Laboratory Ltd.
    Inventors: Akira Kikuchi, Kenji Araki, Katsumi Oshiro
  • Patent number: 4430796
    Abstract: This invention discloses a method and an apparatus in which coordinates of points on a plurality of sections of a three dimensional thing are measured based on a plurality of different coordinate systems and then transformed into those in a single reference coordinate system.
    Type: Grant
    Filed: February 3, 1982
    Date of Patent: February 14, 1984
    Assignee: Kosaka Laboratory Ltd.
    Inventor: Haruki Nakagawa
  • Patent number: 4384407
    Abstract: This invention discloses a three dimensional including contour tracing means such as an orthogonal coordinate mechanism and a polar coordinate mechanism having a probe which can trace the contour of a thing defined by a section, a processing means for processing the data gained by tracing operation of the probe following the contour to generate coordinate components of points on the contour in an orthogonal coordinates system one coordinate axis of which is normal to the section, a detecting means which is adapted to detect if the probe goes outside of the area defined between two planes which are set at the opposite sides of and parallel to the section, and an alarm means which gives an alarm (sound, light or other) when the detecting means detects that the probe has gone beyond the above area, the tow planes being spaced from the section a predetermined tolerance.
    Type: Grant
    Filed: August 28, 1981
    Date of Patent: May 24, 1983
    Assignee: Kosaka Laboratory Ltd.
    Inventor: Kozo Miyamoto