Abstract: The present invention relates to controlling germination of barley in the malting process. More particularly, the invention relates to the treatment of malting barley by ionizing radiation prior to the malting process.

Abstract: The invention provides on a method for measuring the spectrum of a material, wherein a sample (10) of the material to be tested is irradiated with a radiation of required wavelengths and the spectrum signals produced by an intensity measuring unit (34) as a result of the radiation reflected or transmitted by the sample (10) are measured.

Abstract: The invention relates to a grating monochromator for providing monochromatic radiation the wavelength of which is linearly proportional to a translation or rotation, said monochromator comprising an optical device including a reflection grating (1), an entrance slit (4) transmitting a beam onto the optical device, an exit slit (5) transmitting the beam reflected by the optical device, and a mechanism for moving the optical device and at least one of the slits (4,5) with respect to each other.

Abstract: The invention relates to a detector system for measuring the intensity of a radiation scattered at a predetermined angle from a sample (10) irradiated at a specified angle of incidence. The detector system comprises a path to transmit an incident beam of radiation onto the sample (10) and at least one radiation sensor (15,16,17,18; 35,36, . . . ; 45) positioned in the path of the radiations scattered from the sample (10). According to the invention the detector system has a dome positioned in the path of the radiation scattered from the sample (10). The dome is provided with at least one concave reflecting surface (11,12,13,14; 31,32, . . . ; 41) located in a range corresponding to the predetermined scattering angle, and the or each concave reflecting surface forms the image of the sample (10) onto a radiation sensor (15,16,17,18; 35,36, . . . ; 45). For example a 0.degree./45.degree.

Abstract: The invention relates to a spectrophotometer operating at discrete wavelengths comprising diodes to emit variable, substantially monochromatic radiation for irradiating a sample (10) to be tested, a radiation detector (12) sensing the intensity of the radiation reflected or transmitted by the sample (10) and a signal processing unit connected to the radiation detector (12). The diodes comprise radiation sources (2) emitting substantially monochromatic radiation of different wavelengths, a holder (1) supporting the radiation sources (2) and an optical arrangement (5,6) for transmitting the radiation emitted by the radiation sources (2) successively towards the sample (10). The optical arrangement may comprise at least one mirror (5) supported rotatably with respect to the holder (1).