Patents Assigned to KP Technology Ltd.
  • Measurement apparatus
    Patent number: 8866505
    Abstract: A measurement apparatus for surface analysis carried out in a gaseous environment such as air comprises a measurement device capable of measuring a contact potential difference between a probe and a surface, and a light source that triggers photoelectric emission from a sample. The apparatus may operate in “dual” photoemission and contact potential difference (CPD) measurement modes.
    Type: Grant
    Filed: February 21, 2013
    Date of Patent: October 21, 2014
    Assignee: KP Technology Ltd.
    Inventor: Iain Baikie