Patents Assigned to Kratos Analytical Ltd.
  • Combined magnetic sector mass spectrometer and time-of-flight mass spectrometer
    Patent number: 5171987
    Abstract: A mass spectrometry system includes a double-focusing magnetic sector mass spectrometer and a time-of-flight spectrometer arranged in parallel. The spectrometers share a common means for exciting ions from a sample, and a common transfer optics system. An interleaved control system for the two spectrometers, is arranged also to control a sampling handling arrangement dependent on the output of the time-of-flight spectrometer, so as to enable the double-focusing magnetic sector mass spectrometer to analyze a region of interest on a sample.
    Type: Grant
    Filed: March 19, 1991
    Date of Patent: December 15, 1992
    Assignee: Kratos Analytical Ltd.
    Inventors: John D. Waldron, Mark G. Dowsett, Peter J. Derrick