Abstract: An electron spectrometer includes a hemispherical analyzer and a multi-element optical lens system. The lens system has, at its entrance, two spaced apart mesh elements which are concave toward the sample, for reducing the lens aberrations, and switching means operable to change the potentials on the lens elements to optimize the performance of the spectrometer for both Auger Electron Spectrometry and X-ray Spectrometry.

Abstract: Charged-particle spectroscopy apparatus for the chemical analysis of a sample in which an apertured plate receives charged particles emitted from the sample and transmits them to an analyzer for analyzing the energies of the particles, the aperture of the plate being such as to restrict the particles passing therethrough to a pencil beam of particles from a selected area of the sample.

Abstract: The electron microscope has an evacuated housing 9 comprising a portion 14 containing an electron gun 10 from which a beam 11 of electrons is accelerated by accelerator 12 and directed into a microscopic column 16 forming part of housing 9. An ion-stopping member 33 is located in the accelerator 12 on the axis of column 16, to intercept ions which could otherwise pass to the specimen S. In order to avoid interception of the electron beam, the beam is directed along a path which avoids the member 33, either by a displacement or inclination of the gun or by electron beam deflection means (e.g. coils 35c, 36c), and the beam is deflected back on to the axis of the column 16 by electron beam deflection means (e.g. coils 33c, 34c).