Abstract: A projector for selectively projecting patterns of light onto a remote object, one use of which is in conjunction with a system to establish measurements of the surface characteristics of the object, the projector including at least one light source and associated lens assembly mounted to project light onto the remote object, and a rotatable mask member having two or more segments, each segment a distinctive optical pattern, which mask can be rotated as to position a selected one of the segments between the light source and the projection lens assembly whereby when light is directed through the selected segment the light projected onto the remote object will be modified by the optical pattern on that segment.

Abstract: A system for producing data to represent the three-dimensional shape of a surface including a projector for projecting patterns onto the surface. A sensor for producing representations of selected imaged patterns as projected onto the surface, and a device containing data that represents the relative positions of the projector and the sensor for processing data produced by sensor to generate output data that is representative of the shape of the surface.

Abstract: A method and apparatus of measurement and/or dimensional comparison.