Abstract: A test automation system for efficiently testing a wide range of devices, including embedded devices, IoT devices, mobile devices, and edge AI devices, is disclosed. The system employs a unique architecture and technical solutions to overcome limitations of existing testing platforms. It provides a comprehensive and flexible testing solution by incorporating modular components. The system includes a device integration package (DIP) that enables the system to communicate with and test any type of device. The system enables efficient management of diverse device types, streamlined test case creation and execution, and intelligent analysis of test results. Through its innovative design, the test automation system addresses the technical challenges associated with testing heterogeneous devices, enhancing the efficiency and effectiveness of the testing process.