Abstract: Method for conversion of a measurement of an lens (1) comprising the following steps: receiving an experimental lens measurement (EXP) of the lens (1) from a light measurement of the lens (1); determining from the experimental lens measurement (EPX) a digital lens model representing the lens (1) (Si); determining, based on the digital lens model, a converted digital lens measurement (SIM2) representing a converted lens measurement of the lens (1) (S2); determining, based on the experimental lens measurement (EXP1) and the converted digital lens measurement (SIM2), a measurement result (CON) for the lens (1) (S3).

Abstract: A system for measuring (200) a sample (2) by deflectometry comprising: a source (10) for generating a light beam in a source plane (105); an illumination module (19) for forming an illumination beam (9) comprising: a first converging optical element (18); a first selection optical element (16) with a first aperture (160); reflective matrix optical modulation means (30) to form a pattern (7), said first aperture (160) being configured to control the angles of said illumination beam (9) on said reflective matrix optical modulation means (30); a Schlieren lens (20) for obtaining an angle-intensity encoding of said pattern (7) on the sample (2); imaging (40) and detecting means (50) for detecting an image of said sample (2).

Abstract: Described herein is a hyperspectral imaging system in which a polarizing beam splitter, a Wollaston prism, an optical system, and a plane mirror are arranged on an optical axis of the imaging system. An imaging detector is provided on which radiation is focused by an imaging lens. The Wollaston prism is imaged on itself by the optical system and the plane mirror so that translation of the Wollaston prism in a direction parallel to a virtual split plane of the prism effectively provides an optical path length difference that is the same for all points in the object field.

Abstract: Described herein is a hyperspectral imaging system in which a polarising beam splitter, a Wollaston prism, an optical system, and a plane mirror are arranged on an optical axis of the imaging system. An imaging detector is provided on which radiation is focused by an imaging lens. The Wollaston prism is imaged on itself by the optical system and the plane mirror so that translation of the Wollaston prism in a direction parallel to a virtual split plane of the prism effectively provides an optical path length difference that is the same for all points in the object field.

Abstract: The present invention relates to a Fourier transform deflectometry system (1) and method for the optical inspection of a phase and amplitude object (2) placed in an optical path between a grating (3) and an imaging system (4), at a distance h of said grating 3. The grating (3) forms a contrast-based periodic pattern with spatial frequencies ?0, v0 in, respectively, orthogonal axes x,y in an image plane, and the imaging system (4) comprises an objective (5) and an imaging sensor (6) comprising a plurality of photosensitive elements. Spatial frequencies ?0, v0 are equal or lower than the Nyquist frequencies of the imaging system in the respective x and y axes. According to the method of the invention, a first image of said pattern, distorted by the phase and amplitude object (2), is first captured through the objective (5) by the imaging sensor (6).

Abstract: The present invention relates to a Fourier transform deflectometry system (1) and method for the optical inspection of a phase and amplitude object (2) placed in an optical path between a grating (3) and an imaging system (4), at a distance h of said grating 3. The grating (3) forms a contrast-based periodic pattern with spatial frequencies ?0, v0 in, respectively, orthogonal axes x,y in an image plane, and the imaging system (4) comprises an objective (5) and an imaging sensor (6) comprising a plurality of photosensitive elements. Spatial frequencies ?0, v0 are equal or lower than the Nyquist frequencies of the imaging system in the respective x and y axes. According to the method of the invention, a first image of said pattern, distorted by the phase and amplitude object (2), is first captured through the objective (5) by the imaging sensor (6).