Patents Assigned to Lasag S.A.
  • Patent number: 4354272
    Abstract: A solid crystal laser emission device with an emission crystal and a gas discharge tube in a pumping cavity provided with a cooling circuit for cooling both emission crystal and discharge tube. The crystal and discharge cooling circuit is provided at least with a thermal conductor in contact with the crystal and with the discharge tube, each thermal conductor being further in contact with at least a dissipating wall of the pumping cavity. The crystal cooling circuit is provided with a set of three metal clamps having a longitudinal axis of symmetry perpendicular to the longitudinal axis of the crystal, the metal clamps encompassing the crystal approximately at its median zone and at each of its extremities.
    Type: Grant
    Filed: July 14, 1980
    Date of Patent: October 12, 1982
    Assignee: Lasag S.A.
    Inventors: Hans-Peter Schwob, Peter Soppelsa
  • Patent number: 4283146
    Abstract: An optical detector for the detection of very small objects comprises a first optical system defining an optical path and being operable to transmit electromagnetic radiation onto an object to be detected; a second optical system defining an optical path parallel to said optical path of said first optical system and being operable to receive said electromagnetic radiation after diffusion and reflection by said object; and a converging lens associated in common with said first and second optical systems and arranged such that said optical paths of said first and second optical systems are parallel to and symmetrical about the axis of said converging lens on one side thereof.
    Type: Grant
    Filed: November 30, 1978
    Date of Patent: August 11, 1981
    Assignee: Lasag S.A.
    Inventor: Philippe Roussel
  • Patent number: 4272196
    Abstract: A process and mask for use in the process making it possible optically to measure precisely and rapidly sizes in elevation. A group of fringes of regular light, in uniform translation at constant velocity, is projected on the object to be measured and the image of the projected fringes is observed. The measurement of the phase difference of the reflected or diffused light signal at two points of the masked image plane is proportional to a variation in the relative height of the two corresponding object points, thereby allowing comparison to a control piece. The process makes it possible to measure absolute or relative sizes in elevation at two critical points of pieces in a production line. It also makes it possible to determine the profile of any piece.
    Type: Grant
    Filed: January 12, 1979
    Date of Patent: June 9, 1981
    Assignee: Lasag S.A.
    Inventor: Guy Indebetouw
  • Patent number: 4057741
    Abstract: A logic circuit for dynamic D-flip-flop includes five n-channel MOS transistors and five p-channel MOS transistors. When used as a shift register stage, it works correctly without any additional delay element or capacitor. With two more MOS-transistors, the logic circuit works correctly with any sequence of input signals.
    Type: Grant
    Filed: September 16, 1975
    Date of Patent: November 8, 1977
    Assignee: Lasag S.A.
    Inventor: Christian Piguet