Abstract: For multi-dimensional high-resolution imaging a structure marked with fluorescence markers, fluorescence enabling light is focused to illuminate a measurement area in a sample. A partial area of the measurement area is subjected to fluorescence inhibiting light. The partial area omits a center of the measurement area in that an intensity distribution of the fluorescence inhibiting light comprises a line-shaped intensity minimum. A minimal extension of the intensity minimum in a direction through the center area is by a factor k?2 smaller than a diameter of the measurement area in said direction. Without spatial resolution, fluorescence light emitted out of the measurement area is measured for a plurality of consecutive angle positions of the intensity minimum about the center, while the measurement area, for each angle position, is subjected to the fluorescence enabling light. A value of the measured fluorescence light is assigned to the position of the center.

Abstract: The invention relates to an ablative production device and method for a periodic line structure on a workpiece. The device comprises a pulsed laser for generating ablative light, a phase mask arranged in the beam path of the ablative light, imaging optics arranged on an optical axis and a holder to hold the workpiece in an image plane. The phase mask produces a plurality of equidistant parallel lines in an object plane by interference and suppresses an order of diffraction parallel to the optical axis. The optical axis is perpendicular to the object plane. The imaging optics comprises a cylindrical lens, which is aligned in parallel to the lines and is designed to image the object plane into the image plane.

Abstract: The invention relates to a method and a device for modifying in a spatially periodic manner at least in some regions a surface of a substrate (24), said surface being disposed on a sample plane (P) for which end different regions (211, 221, 231, 232) of the substrate surface are acted upon successively with a spatially periodic illumination pattern of an energy density above a processing threshold of the substrate surface, where the illumination pattern is generated by diffraction of an input beam (10) and superimposition of resulting, diffracted sub-beams (12, 14) by means of a grid interferometer (100), and where, in order to select the substrate surface region to be illuminated in each case (211, 221, 231, 232), the input beam (10) is deviated by means of a beam-deviating unit (16) arranged upstream of the grid interferometer (100).

Abstract: The invention relates to a method and a device for modifying in a spatially periodic manner at least in some regions a surface of a substrate (24), said surface being disposed on a sample plane (P) for which end different regions (211, 221, 231, 232) of the substrate surface are acted upon successively with a spatially periodic illumination pattern of an energy density above a processing threshold of the substrate surface, where the illumination pattern is generated by diffraction of an input beam (10) and superimposition of resulting, diffracted sub-beams (12, 14) by means of a grid interferometer (100), and where, in order to select the substrate surface region to be illuminated in each case (211, 221, 231, 232), the input beam (10) is deviated by means of a beam-deviating unit (16) arranged upstream of the grid interferometer (100).

Abstract: A method for manufacturing an optical component in which an optical function of the component is created for electromagnetic radiation in an application wavelength range, using laser machining with laser radiation in a machining wavelength range, characterized in that the following steps are carried out: 1) A solid body is provided that is made from a material that in the raw state absorbs the laser radiation in the machining wavelength range, 2) Laser machining is carried out on the solid body employing one or more machining steps and 3) The material of the solid body is transformed into a final state in which the solid body is transparent to the electromagnetic radiation in the application wavelength range and thus fulfills the intended optical function.