Abstract: A system and method for detecting deteriorated junctions within an electrical circuit includes a voltage channel circuit, a load circuit, and a microcontroller. The voltage channel circuit is connectable to the electrical circuit and includes a multiplier circuit, a peak detector circuit, and a filter circuit. The multiplier circuit is configured to square a line voltage of the electrical circuit. The peak detector circuit is configured to detect peak voltages of the line voltage based on an output of the multiplier circuit. A DC output voltage is provided from the filter circuit based on the output of the multiplier circuit. The load circuit is connectable to the electrical circuit and includes a plurality of resistors and a plurality of switches controlled by the microcontroller to enable current flow through the plurality of resistors to control the line voltage.

Abstract: A system for testing an electrical circuit includes a handheld device, and first and second plug-in modules. The handheld device includes a first sensor that senses a current within the electrical circuit, and a second sensor that senses a voltage within the electrical circuit. The first plug-in device is connectable to a first outlet of the electrical circuit and configured to provide an identification number on the electrical circuit. The second plug-in device is connectable to a second outlet of the electrical circuit and configured to display the identification number of the first plug-in device. The handheld device receives the identification number from the first plug-in device and displays the identification number.