Patents Assigned to Linus K. Frevel
  • Patent number: 4247771
    Abstract: A novel parafocusing X-ray diffractometer operates by irradiating a thin ring of fine crystals with a point source of monochromatic X-rays and passing the cone of diffracted X-rays at each focal point through a pinhole to an X-ray sensor, thereby obtaining optimum values for both line intensity and resolution of lines.
    Type: Grant
    Filed: October 9, 1979
    Date of Patent: January 27, 1981
    Assignees: Karl M. Kadish, Linus K. Frevel, Gordon H. Frevel
    Inventor: Ludo K. Frevel