Abstract: A novel parafocusing X-ray diffractometer operates by irradiating a thin ring of fine crystals with a point source of monochromatic X-rays and passing the cone of diffracted X-rays at each focal point through a pinhole to an X-ray sensor, thereby obtaining optimum values for both line intensity and resolution of lines.
Type:
Grant
Filed:
October 9, 1979
Date of Patent:
January 27, 1981
Assignees:
Karl M. Kadish, Linus K. Frevel, Gordon H. Frevel