Abstract: An apparatus and methods of inspecting, analyzing, classifying, and/or grading quality of a transparent sheet using a data set of photoelasticity measurements, thickness measurements, segmentation specifications, measurement specifications and quality control specifications of the transparent sheet. A results measurement is calculated on a computing system, quality control specifications are applied to the results measurement allowing writing to the database and creating reports, sending results to an operator interface and machine control.

Abstract: This present invention relates to an apparatus and method for measuring the profile and reflective optical power of one or more surfaces of transparent sheets and transmissive optical power and thickness of one or more transparent sheets at a plurality of locations over the complete transparent sheet. The measurement results are presented to a user graphically and all data is stored for further processing, process control, and quality assurance.

Abstract: A method and device are provided for detecting and determining a type of a coating on either surface of a transparent sheet, measuring a thickness of the transparent sheet and measuring a spacing between at least two transparent sheets. The method and device include at least three discrete light sources, a 2D image generating device, a lens, and a processor. A reflected image area from the surfaces of the transparent sheet from each of the at least three discrete light sources produces a sparse spectrometer profile used to detect the coating and to determine the type of coating on either surface of the transparent sheet. A distance between the reflected image position from the at least three discrete light sources from both surfaces of the transparent sheet is used to calculate the thickness of the transparent sheet and the spacing between at least two transparent sheets.

Abstract: A method and device are provided for detecting and determining a type of a coating on either surface of a transparent sheet, measuring a thickness of the transparent sheet and measuring a spacing between at least two transparent sheets. The method and device include at least three discrete light sources, a 2D image generating device, a lens, and a processor. A reflected image area from the surfaces of the transparent sheet from each of the at least three discrete light sources produces a sparse spectrometer profile used to detect the coating and to determine the type of coating on either surface of the transparent sheet. A distance between the reflected image position from the at least three discrete light sources from both surfaces of the transparent sheet is used to calculate the thickness of the transparent sheet and the spacing between at least two transparent sheets.

Abstract: An apparatus which measures a size and a shape of a transparent sheet includes a conveyor, a lighting apparatus, an imaging device and a process controller. The conveyor moves the transparent sheet. The lighting apparatus projects light onto the transparent sheet. The imaging device receives reflected light reflected from the transparent sheet. A thickness is input into the process controller. A sheet temperature from a sheet temperature sensor and/or a structure temperature from a structure temperature sensor are output to the process controller. An image is output from the imaging device to the process controller. The process controller outputs the size and the shape of the transparent sheet. The outputs from the process controller are used to adjust machine tools used to fabricate the transparent sheet.

Abstract: An apparatus which measures a size and a shape of a transparent sheet includes a conveyor, a lighting apparatus, an imaging device and a process controller. The conveyor moves the transparent sheet. The lighting apparatus projects light onto the transparent sheet. The imaging device receives reflected light reflected from the transparent sheet. A thickness is input into the process controller. A sheet temperature from a sheet temperature sensor and/or a structure temperature from a structure temperature sensor are output to the process controller. An image is output from the imaging device to the process controller. The process controller outputs the size and the shape of the transparent sheet. The outputs from the process controller are used to adjust machine tools used to fabricate the transparent sheet.

Abstract: A method and apparatus for controlling the process used in the heat treatment of glass measures the quality of the glass following the heat treatment process. Inputs to the control system for the heat treatment process derive from the automated inspection of glass following heat treatment. Outputs from the control system for the heat treatment process may adjust one or more parameters in the heat treatment process including a furnace or heating setting, a transport setting, and a quench or cooling setting.

Abstract: An apparatus and methods for the real-time inspection for defects in and on transparent sheets, such as a sheet of glass, are described. A sensor detects a transparent light reflective coating on a transparent sheet and defines a sample profile. An optical inspection system utilizes an illumination source and an imaging device to obtain images of the transparent sheets. An image processing system analyzes for defects in the transparent sheets, including coating defects and defects in edge deleted perimeters. Inspection variables which correspond to the sample profile are used by the optical inspection system and image processing system for real-time inspection.

Abstract: A method and apparatus for detecting and measuring the optical distortion in pieces of glass and other reflective sheets are disclosed. The method inspects the full length and width of large area glass sheets or multiple sheets comprising a load of glass and uses optical magnification of a reflected circular image of precise size. A plurality of circular images is projected onto the glass and reflect as ellipsoids representative of local surface contours. The major and minor axes of the reflected axis define the axis of greatest magnification and demagnification. Distortions in the glass surface are measured in lens power as localized magnification at the elliptical axis. The angle and magnitude of the minor and major axis of the reflected ellipsoids provide data to map the surface profile of the glass. The method measures distortion of random or periodic frequency and measures distortion in all axes.