Abstract: At the boundary where the number of effective chips changes, at least three grid points of a chip grid intersect with the periphery of a wafer effective region, and a triangle connecting these three grid points together includes therein the wafer center. To design a semiconductor chip, this feature is used to determine, by an analytic process, candidate solutions including different numbers of effective chips. These candidate solutions are used to derive an advantageous solution.
Abstract: At the boundary where the number of effective chips changes, at least three grid points of a chip grid intersect with the periphery of a wafer effective region, and a triangle connecting these three grid points together includes therein the wafer center. To design a semiconductor chip, this feature is used to determine, by an analytic process, candidate solutions including different numbers of effective chips. These candidate solutions are used to derive an advantageous solution.