Abstract: A system and method for estimating noise using measurement based parametric fitting non-uniformity correction is disclosed. Fixed pattern noise (“FPN”) is estimating from an overall noise component within a detection system to enhance candidate target detection and tracking. A sensor in the detection system receives energy, such as radiant flux, that is converted to a digital image. A non-uniformity correction device generates an estimated FPN according to an applicable temperate range and integration time. A memory storing an array of coefficients is accessed to determine the estimated FPN. The valves within the array of coefficients are based on actual FPN measurements that are parametrically fitted.
Type:
Grant
Filed:
December 4, 2003
Date of Patent:
June 24, 2008
Assignee:
Lockheed Martin Missiles & Fire Control
Inventors:
Hai-Wen Chen, Felix M. Fontan, Teresa L. Olson