Patents Assigned to Lumina Geophysical LLC
  • Patent number: 9507042
    Abstract: An inversion-based algorithm for computing the time frequency analysis of reflection seismograms using constrained least-squares spectral analysis is formulated and applied to modeled seismic waveforms and real seismic data. The Fourier series coefficients are computed as a function of time directly by inverting a basis of truncated sinusoidal kernels for a moving time window. Spectra may be provided that have reduced window smearing for a given window length relative to the discrete Fourier transform irrespective of window shape, and a time-frequency analysis with a combination of time and frequency resolution that is superior to the short time Fourier transform and the continuous wavelet transform. The reduction in spectral smoothing enables enhanced determination of spectral characteristics of interfering reflections within a short window. The degree of resolution improvement relative to the short time Fourier transform increases as window length decreases.
    Type: Grant
    Filed: September 3, 2013
    Date of Patent: November 29, 2016
    Assignee: Lumina Geophysical LLC
    Inventors: Charles Puryear, John Castagna, Oleg Portniaguine
  • Publication number: 20140067273
    Abstract: An inversion-based algorithm for computing the time frequency analysis of reflection seismograms using constrained least-squares spectral analysis is formulated and applied to modeled seismic waveforms and real seismic data. The Fourier series coefficients are computed as a function of time directly by inverting a basis of truncated sinusoidal kernels for a moving time window. Spectra may be provided that have reduced window smearing for a given window length relative to the discrete Fourier transform irrespective of window shape, and a time-frequency analysis with a combination of time and frequency resolution that is superior to the short time Fourier transform and the continuous wavelet transform. The reduction in spectral smoothing enables enhanced determination of spectral characteristics of interfering reflections within a short window. The degree of resolution improvement relative to the short time Fourier transform increases as window length decreases.
    Type: Application
    Filed: September 3, 2013
    Publication date: March 6, 2014
    Applicant: Lumina Geophysical LLC
    Inventors: Charles I. Puryear, John P. Castagna, Oleg N. Portniaguine