Abstract: A specimen trap including a container forming a chamber. A strainer is fixedly positioned within the chamber and defines an upper portion of the chamber and a lower portion of the chamber. The strainer has a porous surface that provides fluidic communication between the upper portion and the lower portion. One tube connection is mounted to the cap and forms a passage through the cap and another tube extends through the cap and through the strainer into the lower portion. The cap is rotatable with respect to the container to form communication between one of the specimen compartments and the one tube connection passage for collection of an independent specimen.

Abstract: The invention is a structural improvement for wafer supporting apparatus, which is applied in a machine capable of providing a support for a wafer during a manufacturing process of semiconductor.