Abstract: A system and method for simplifying the testing and manufacturing process of multi-board solid-state storage systems. The system is constructed by placing secondary non-volatile memory components onto every board in multi-board system that carries primary solid-state components. This allows separate or independent testing of the boards, and final construction of the solid-state system by simply connecting these boards, without the need to either test the completely constructed system or to transfer geometry, faulty location and auxiliary records if the boards have been tested independently.