Abstract: In a process for determining the layer thickness of semiconductor layer structures, a sample of a multilayer semi-conductor (4) is placed in contact with an electrolyte (2) then subjected to anodic etching during which the depth of etching is determined by integration of the current. During etching, the sample (4) is also excited by an electric signal and the real component of the admittance and hence the conductance of the probe at the frequency of excitation is determined, the extreme values of this component are analyzed, and the values of the depth of etching corresponding to these extremes, which characterize the junctions between the layers of the sample (4) tested, are determined.
Type:
Grant
Filed:
February 8, 1989
Date of Patent:
February 26, 1991
Assignee:
Magyar Tudomanyos Akademia Muszaki Fizikai Kutato Intezete
Inventors:
Gyorgy Ferenczi, Katalin Erdelyi, Maria Somogyi, Janos Boda, Gyorgy Fule, Gabor Aszodi
Abstract: A method for determining charged energy states of a sample of a semiconductor or insulator material by using deep level transient spectroscopy.
Type:
Grant
Filed:
November 4, 1982
Date of Patent:
February 18, 1986
Assignee:
Magyar Tudomanyos Akademia Muszaki Fizikai Kutato Intezete
Inventors:
Gyorgy Ferenczi, Janos Boda, Ferenc Toth, Peter Horvath, Laszlo Benkovics, Laszlo Dozsa
Abstract: A Deep Level Transient Spectroscopy (DLTS) method in which a high frequency measuring signal is applied continuously on a semiconductor junction, and exciting pulses are generated which are coupled through fast semiconductor switching elements to the junction to alternatively bias the junction in reverse and forward (or slightly reverse) directions. The high frequency measuring signal passed through the junction is evaluated by means of a lock-in amplifier phase-locked with a constant phase angle, independent of the repetition rate of the exciting pulses.The evaluation circuits of the apparatus including the lock-in amplifier are controlled by switching elements driven by control signals generated from the exciting pulses.
Type:
Grant
Filed:
June 3, 1981
Date of Patent:
March 13, 1984
Assignee:
Magyar Tudomanyos Akademia Muszaki Fizikai Kutato Intezete
Inventors:
Gyorgy Ferenczi, Peter Horvath, Ferenc Toth, Jozsef Kiss, Janos Boda
Abstract: A method and an apparatus for the differential thermal analysis of materials includes heating a first sample to be investigated and a reference sample by radiation heat transfer from respective separated radiation sources, controlling both sources according to a predetermined temperature program for the samples, interposing an element that partly transmits radiation between each of the samples and their associated sources, sensing the temperature difference between the elements, controlling one of the radiation sources in response to the temperature difference to equalize the temperature of the elements and measuring the temperature difference between the samples during the temperature program.
Type:
Grant
Filed:
November 5, 1979
Date of Patent:
December 8, 1981
Assignee:
Magyar Tudomanyos Akademia Muszaki Fizikai Kutato Intezete
Inventors:
Laszlo Bartha, Csaba Lenart, Karoly Nemeth, Elemer Nagy