Abstract: A structured light projector includes an optical mask and a light emitter. The light emitter can be capable of illuminating the optical mask, and the optical mask can be capable of transforming the light from the emitter so as to provide structured light bi-dimensional coded light pattern that includes a plurality of feature types formed by a unique combination of feature elements. The projected light pattern includes one or more markers which include pairs of feature elements between which the epipolar distances are modified relative to distances between respective feature elements in non-marker areas of the pattern, and an appearance of feature elements within the marker and across the marker's edges is continuous.

Abstract: A system, apparatus and method of obtaining data from a 2D image in order to determine the 3D shape of objects appearing in said 2D image, said 2D image having distinguishable epipolar lines, said method comprising: (a) providing a predefined set of types of features, giving rise to feature types, each feature type being distinguishable according to a unique bi-dimensional formation; (b) providing a coded light pattern comprising multiple appearances of said feature types; (c) projecting said coded light pattern on said objects such that the distance between epipolar lines associated with substantially identical features is less than the distance between corresponding locations of two neighboring features; (d) capturing a 2D image of said objects having said projected coded light pattern projected thereupon, said 2D image comprising reflected said feature types; and (e) extracting: (i) said reflected feature types according to the unique bi-dimensional formations; and (ii) locations of said reflected feature

Abstract: According to examples of the presently disclosed subject an active triangulation system includes an active triangulation setup and a calibration module. The active triangulation setup includes a projector and a sensor. The projector is configured to project a structured light pattern that includes a repeating structure of a plurality of unique feature types and a plurality of markers distributed in the projected structured light pattern, where an epipolar distance between any two epipolar lines which are associated with an appearance in the image of any two respective markers is greater than a distance between any two distinguishable epipolar lines. The sensor is configured to capture an image of a reflected portion of the projected structured light. The calibration module is configured to determine an epipolar field for the active triangulation setup according to locations of the markers in the image, and to calibrate the active triangulation setup.

Abstract: A technique for 3D registration of three or more 3D models using parallel computing. The technique treats the pairwise 3D registration problem as an atomic sub-problem, and solves in parallel a plurality of pairwise 3D registration. The initial guess for the pairwise 3D registration is calculated based on the, possibly incomplete, information available at the moment the calculation is made. At each point the available pairwise transformations are examined based on current available information. Transformations that are identified as outliers or as inaccurate are marked for repeated pairwise 3D registration when additional information relevant for the calculation of the initial guess becomes available.

Abstract: Disclosed are methods, circuits, optical assemblies, devices, systems and associated computer executable code for estimating for three dimensional imaging. According to some embodiments, there may be provided a projector operable to project a bi-dimensionally coded pattern to provide a first projection of the bi-dimensionally coded pattern and a second projection of the bi-dimensionally coded pattern. The first projection and the second projection may be offset or rigidly shifted with respect to one another, such that a first reflection off an object which is associated with the first projection and a second reflection off the object which is associated with the second projection are provided. A signal corresponding to the first reflection and a signal corresponding to the second reflection may be co-processed.

Abstract: A structured light projector includes an optical mask and a light emitter. The light emitter can be capable of illuminating the optical mask, and the optical mask can be capable of transforming the light from the emitter so as to provide structured light bi-dimensional coded light pattern that includes a plurality of feature types formed by a unique combination of feature elements. The projected light pattern includes one or more markers which include pairs of feature elements between which the epipolar distances are modified relative to distances between respective feature elements in non-marker areas of the pattern, and an appearance of feature elements within the marker and across the marker's edges is continuous.

Abstract: A 3D imaging apparatus comprising a projector, comprising a laser array comprising a plurality of individual emitters, a mask for providing a structured light pattern, wherein a distance between the laser array and the mask is substantially minimized according to a non-uniformity profile of the plurality of individual emitters and according to a uniformity criterion related to the light intensity distribution across the mask plane, projection optics to image the structured light pattern onto an object, an imaging sensor adapted to capture an image of the object with the structured light pattern projected thereon and a processing unit adapted to process the image to determine range parameters.

Abstract: A method and apparatus for obtaining an image to determine a three dimensional shape of a stationary or moving object using a bi dimensional coded light pattern having a plurality of distinct identifiable feature types. The coded light pattern is projected on the object such that each of the identifiable feature types appears at most once on predefined sections of distinguishable epipolar lines. An image of the object is captured and the reflected feature types are extracted along with their location on known epipolar lines in the captured image. Displacements of the reflected feature types along their epipolar lines from reference coordinates thereupon determine corresponding three dimensional coordinates in space and thus a 3D mapping or model of the shape of the object at any point in time.

Abstract: A method and apparatus for obtaining an image to determine a three dimensional shape of a stationary or moving object using a bi dimensional coded light pattern having a plurality of distinct identifiable feature types. The coded light pattern is projected on the object such that each of the identifiable feature types appears at most once on predefined sections of distinguishable epipolar lines. An image of the object is captured and the reflected feature types are extracted along with their location on known epipolar lines in the captured image. Displacements of the reflected feature types along their epipolar lines from reference coordinates thereupon determine corresponding three dimensional coordinates in space and thus a 3D mapping or model of the shape of the object at any point in time.

Abstract: A method and apparatus for obtaining an image to determine a three dimensional shape of a stationary or moving object using a bi dimensional coded light pattern having a plurality of distinct identifiable feature types. The coded light pattern is projected on the object such that each of the identifiable feature types appears at most once on predefined sections of distinguishable epipolar lines. An image of the object is captured and the reflected feature types are extracted along with their location on known epipolar lines in the captured image. Displacements of the reflected feature types along their epipolar lines from reference coordinates thereupon determine corresponding three dimensional coordinates in space and thus a 3D mapping or model of the shape of the object at any point in time.

Abstract: A method and apparatus for obtaining an image to determine a three dimensional shape of a stationary or moving object using a bi dimensional coded light pattern having a plurality of distinct identifiable feature types. The coded light pattern is projected on the object such that each of the identifiable feature types appears at most once on predefined sections of distinguishable epipolar lines. An image of the object is captured and the reflected feature types are extracted along with their location on known epipolar lines in the captured image. Displacements of the reflected feature types along their epipolar lines from reference coordinates thereupon determine corresponding three dimensional coordinates in space and thus a 3D mapping or model of the shape of the object at any point in time.