Patents Assigned to Maruwa Electronic Inc.
  • Patent number: 8128731
    Abstract: A method for separating and enriching isotopes in an efficient and low-cost manner from a condensation-system (liquid or/and solid) material including two or more different isotopes by taking advantage of the sedimentation of atoms through an acceleration field by ultra-high speed rotation. The condensation-system material is placed in a sedimentation tank which is then housed in a supercentrifuge. The supercentrifuge in its rotor is rotation driven by an ultra-high speed rotation power source, and an acceleration field of energy of 100000 G to 1500000 G, i.e., about 100 to 800 m/s in terms of peripheral velocity, is applied to the above condensed (liquid or/and solid) material under such a temperature that is specified by an isotope material to be enriched. In this case, a difference in centrifugal force applied is provided between the isotopes in the condensed (liquid or/and solid) material comprising the at least two isotopes.
    Type: Grant
    Filed: April 4, 2007
    Date of Patent: March 6, 2012
    Assignees: National University Corporation Kumamoto University, Maruwa Electronic Inc.
    Inventors: Tsutomu Mashimo, Masao Ono, Xinsheng Huang, Yusuke Iguchi, Satoru Okayasu, Hiroshi Yasuoka, Koji Shibasaki, Masanori Sueyoshi
  • Publication number: 20090272265
    Abstract: This invention provides a method for separating and enriching isotopes in an efficient and low-cost manner from a condensation-system (liquid or/and solid) material comprising two or more different isotopes by taking advantage of the sedimentation of atoms through an acceleration field by ultra-high speed rotation. A condensation-system (liquid or/and solid) material (5) comprising the two or more isotopes is placed in a sedimentation tank (for example, 2) which is then housed in a supercentrifuge. The supercentrifuge in its rotor is rotation driven by an ultra-high speed rotation power source, and an acceleration field of energy of 100000 G to 1500000 G, i.e., about 100 to 800 m/s in terms of peripheral velocity, is applied to the above condensed (liquid or/and solid) material under such a temperature that is specified by an isotope material to be enriched.
    Type: Application
    Filed: April 4, 2007
    Publication date: November 5, 2009
    Applicants: NATIONAL UNIVERSITY CORPORATION KUMAMOTO UNIVERSITY, MARUWA ELECTRONIC INC.
    Inventors: Tsutomu Mashimo, Masao Ono, Xinsheng Huang, Yusuke Iguchi, Satoru Okayasu, Hiroshi Yasuoka, Koji Shibasaki, Masanori Sueyoshi
  • Patent number: 6820503
    Abstract: An object of the present invention is to achieve more high-speed rotation of a rotor to which a test object is stored, extending the duration of high-speed rotation, and temperature control of a rotor at the time of high-speed rotation. A high-speed rotation testing apparatus of the present invention comprises: a rotor having a hollow for a test object, to which a predetermined test object is stored; a spindle connected to the rotor; a torque applying device for applying a predetermined torque to the spindle, and a casing for sealing the rotor. The casing comprises a decompressing device and a holder for holding the spindle. The holder has a bushing for supporting the spindle and a bushing supporting member for supporting the bushing by inserting thereto. By forming the inner diameter of at least one of the bushing supporting member larger than the outer diameter of the bushing, the bushing supporting member supports the bushing to be rotatable.
    Type: Grant
    Filed: September 10, 2002
    Date of Patent: November 23, 2004
    Assignees: Maruwa Electronic Inc.
    Inventors: Masanori Sueyoshi, Akira Tezuka, Koji Shibasaki, Xinsheng Huang, Toyotaka Osakabe, Masao Ono, Tsutomu Mashimo
  • Patent number: 6615670
    Abstract: A high-speed rotation testing apparatus includes a spindle 11 holding a test object S at its lower end, a driving motor 20 for applying torque to the spindle 11, and a frame 30 for supporting a rotor shaft 21 of the driving motor 20 so that the shaft is arranged toward the vertical direction of the apparatus, wherein the spindle 11 is driven directly by a driving motor 20 by inserting the spindle 11 into a through-hole 21a that penetrates the center of the rotor shaft 21 and coupling the upper ends of the rotor shaft 21 and the spindle 11 together, and the through-hole 21a has an inner diameter set so as to form a clearance in which the lower end of the spindle can swing, and further, a damping mechanism 40 that restrains swing is arranged in the vicinity of the lower end of the spindle 11, which projects from the lower end of the rotor shaft 21.
    Type: Grant
    Filed: February 7, 2002
    Date of Patent: September 9, 2003
    Assignee: Maruwa Electronic Inc.
    Inventors: Koji Shibasaki, Takeshi Watabe, Shiro Shibasaki
  • Publication number: 20020112546
    Abstract: A high-speed rotation testing apparatus includes a spindle 11 holding a test object S at its lower end, a driving motor 20 for applying torque to the spindle 11, and a frame 30 for supporting a rotor shaft 21 of the driving motor 20 so that the shaft is arranged toward the vertical direction of the apparatus, wherein the spindle 11 is driven directly by a driving motor 20 by inserting the spindle 11 into a through-hole 21a that penetrates the center of the rotor shaft 21 and coupling the upper ends of the rotor shaft 21 and the spindle 11 together, and the through-hole 21a has an inner diameter set so as to form a clearance in which the lower end of the spindle can swing, and further, a damping mechanism 40 that restrains swing is arranged in the vicinity of the lower end of the spindle 11, which projects from the lower end of the rotor shaft 21.
    Type: Application
    Filed: February 7, 2002
    Publication date: August 22, 2002
    Applicant: Maruwa Electronic Inc.
    Inventors: Koji Shibasaki, Takeshi Watabe, Shiro Shibasaki