Patents Assigned to Materials Research, Inc.
  • Patent number: 4660859
    Abstract: A new process for marking currency to permit easy and positive authentication at a later date comprising exposing a small region of the currency to bombardment by high energy neutrons for a short period, treating the exposed small region with a chemical reagent which reacts with the treated area to form tiny holes which can later be used for authentication. Also provide is a method for authentication which comprises exposing the marked currency to monochromatic X-rays, allowing the transmitted beam to impinge upon a fluorescent screen which will show shiny dots where the beam has reached the screen, said dots corresponding to the tiny holes in the marked currency.
    Type: Grant
    Filed: June 17, 1985
    Date of Patent: April 28, 1987
    Assignee: Materials Research, Inc.
    Inventor: Ram Natesh
  • Patent number: 4546652
    Abstract: Structural failures, as in metal aircraft structures, are rapidly detected and measured by use of a new detection system comprising a thin film adhesively bonded to the metal structural surface to be monitored, said film containing a plurality of thin continuous strips which are adapted to be broken when a crack appears under the strips, said strips being substantially parallel but insulated from each other and the metal structural surface and arranged in a pattern such that there is frequent change in direction of the strips as in a zig-zag or rectangular pattern, each of said strips constituting a separate circuit joined to an electric power source and a sensing and recording means capable of detecting and recording any circuit failure caused by disruption of the metal strip, said disruption being caused by the formation of a crack under the said strip.
    Type: Grant
    Filed: December 22, 1981
    Date of Patent: October 15, 1985
    Assignee: Materials Research, Inc.
    Inventors: Anil V. Virkar, Ram Natesh