Patents Assigned to MATERIALYTICS, LLC
  • Patent number: 9063085
    Abstract: This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
    Type: Grant
    Filed: February 20, 2014
    Date of Patent: June 23, 2015
    Assignee: Materialytics, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV
  • Publication number: 20140185043
    Abstract: This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
    Type: Application
    Filed: February 20, 2014
    Publication date: July 3, 2014
    Applicant: Materialytics, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV
  • Patent number: 8699022
    Abstract: This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
    Type: Grant
    Filed: February 6, 2013
    Date of Patent: April 15, 2014
    Assignee: Materialytics, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV
  • Publication number: 20130204531
    Abstract: This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
    Type: Application
    Filed: February 6, 2013
    Publication date: August 8, 2013
    Applicant: MATERIALYTICS, LLC
    Inventor: Materialytics, LLC