Abstract: In accordance with the present invention, a system and method for converting an implementation of a logic description describing a field programmable device into an implementation of the same logic in a factory-programmed device are provided. In one embodiment of the present invention, an expert system synthesizes a logic circuit model based on the logic description. An automatic test pattern generator provides test vectors including expected response signals for the logic circuit model generated by the expert system. The automatically generated test vectors are provided to a tester which applies the test vectors as input stimuli to the field programmable device. The output signals of the field programmable device are verified against the expected response signals.