Abstract: The invention relates to an apparatus (1) for examining test bodies (P), in particular electronic subassemblies and electronic devices, comprising at least one radiation source (2) for X-raying at least one test body (P), at least one detection unit (3) for detecting radiation (S) emitted by means of the radiation source (2), at least one holding element (4) for holding the at least one test body (P) and for positioning the latter between the radiation source (2) and the detection unit (3), and a movement unit (5), coupled to the holding element (4), for moving the holding element (4), wherein the movement unit (5) is constructed as a parallel-mechanism movement unit.

Abstract: A first x-ray image of the circuit board that is equipped with components only on a first side with a first x-ray device (2) that produces transmission images and a second x-ray image of a circuit board that is equipped with components on both sides with a second x-ray device (4) that produces transmission images are recorded in an x-ray testing method for checking circuit boards that are equipped with components on two sides, in particular for checking soldered joints. A test x-ray image is then evaluated in a computer unit in which the second side that is equipped with components is displayed in enhanced form by forming a function from the pixel values of the first x-ray image and the corresponding pixel values of the second x-ray image.

Abstract: A first x-ray image of the circuit board that is equipped with components only on a first side with a first x-ray device (2) that produces transmission images and a second x-ray image of a circuit board that is equipped with components on both sides with a second x-ray device (4) that produces transmission images are recorded in an x-ray testing method for checking circuit boards that are equipped with components on two sides, in particular for checking soldered joints. A test x-ray image is then evaluated in a computer unit in which the second side that is equipped with components is displayed in enhanced form by forming a function from the pixel values of the first x-ray image and the corresponding pixel values of the second x-ray image.