Patents Assigned to Maxeler Technologies Limited
  • Method of measuring delay in an integrated circuit
    Patent number: 8552740
    Abstract: A method of measuring signal delay in a integrated circuit comprising applying a common clock signal at a circuit input and output, applying a test signal at the circuit input, detecting a corresponding output signal at the circuit output and detecting whether the test signal and output signal occur in a common part of the clock signal.
    Type: Grant
    Filed: December 10, 2008
    Date of Patent: October 8, 2013
    Assignee: Maxeler Technologies Limited
    Inventors: Peter Ying Kay Cheung, Nicholas Peter Sedcole, Justin Sung-Jit Wong