Patents Assigned to MDM Elektrosystem AG
  • Test probe for electrical measuring instruments, particularly for voltmeters
    Patent number: 5512839
    Abstract: The test probe for electrical measuring instruments, particularly for voltmeters, is characterized by an automatic holding device that automatically holds the test probe in a socket-outlet jack of any given design, which device comprises a contact spring at least partially adjacent to a contact pin and bilaterally bulging toward the tip of the contact pin. This results in a universally utilizable test probe that will hold automatically in any jack format of different socket-outlets, shock-hazard protection being ensured at all times.
    Type: Grant
    Filed: April 7, 1994
    Date of Patent: April 30, 1996
    Assignee: MDM Elektrosystem AG
    Inventor: Edoardo De Monaco