Patents Assigned to Measurement Systems, Incorporated
  • Patent number: 5845232
    Abstract: An apparatus and related method for detecting splice gaps and splice overlaps includes a processor having a memory and a plurality of logic tables, wherein the processor is connected to an input/output terminal, a probe, an encoder and a motor which rotates a tire about an axis of rotation. The processor performs several different comparisons upon collected measurement data to reliably ascertain if a sudden change in tire uniformity has occurred. These tests involve comparison of successive data points with one another to determine whether an unacceptable rate of change in the tire uniformity has occurred. If an unacceptable rate of change has occurred, the processor provides such an indication to the input/output terminal.
    Type: Grant
    Filed: May 10, 1996
    Date of Patent: December 1, 1998
    Assignee: Measurement Systems, Incorporated
    Inventors: Richard T. Shively, James R. Shively
  • Patent number: 4046005
    Abstract: A device for generating isometric control signals in three axes is formed of a shaft having opposed pairs of strain gauges mounted thereon at angles to the shaft axis. One end of the shaft is fixed and the opposite free end is operable by the fingers. Electrical circuitry for combining the signals to produce useful outputs is also disclosed.
    Type: Grant
    Filed: June 14, 1976
    Date of Patent: September 6, 1977
    Assignee: Measurement Systems, Incorporated
    Inventor: Robert D. Goroski