Patents Assigned to Megger Instruments Limited
  • Patent number: 8461853
    Abstract: A test vessel assembly comprises a central test vessel defining a chamber in which a sample to be tested may be stored. A pair of side adjustable electrodes is received in the chamber and immersed in the sample under test to determine the breakdown voltage of the sample. A gap between the electrodes can be adjusted by respective electrode adjusting moved in and out of the test vessel by rotation of an associated adjusting wheel. To prevent the breakdown in air rather than in the sample, care is taken to ensure sufficiently large creepage and clearance distances between the connections to the electrodes and from the connections to the electrodes to a wall of the test chamber. To this end, the adjusting wheels include convolutions that mesh with corresponding convolutions in the test vessel.
    Type: Grant
    Filed: September 24, 2010
    Date of Patent: June 11, 2013
    Assignee: Megger Instruments Limited
    Inventors: Simon Clark, Simon Haynes
  • Publication number: 20110285413
    Abstract: A test vessel assembly (10) comprises a central test vessel 12 defining a chamber 18 in which a sample to be tested may be stored. A pair of side adjustable electrodes 30, 30a is received in the chamber and immersed in the sample under test. A gap between the electrodes can be adjusted by respective electrode adjusting assemblies, each comprising a shaft 32 connected to a respective electrode, the shaft being moved in and out of the test vessel 12 by rotation of an associated adjusting wheel 60. In use, each electrode 30, 30a is electrically connected to a contact in an insulated horn of a test assembly via the respective shafts, for the supply of a steadily increasing voltage to determine the breakdown voltage of the sample. To prevent the breakdown in air rather than in the sample, care is taken to ensure sufficiently large creepage and clearance distances between the connections to the electrodes and from the connections to the electrodes to a wall of the test chamber.
    Type: Application
    Filed: September 24, 2010
    Publication date: November 24, 2011
    Applicant: MEGGER INSTRUMENTS LIMITED
    Inventors: Simon Clark, Simon Haynes
  • Patent number: D315691
    Type: Grant
    Filed: December 6, 1988
    Date of Patent: March 26, 1991
    Assignee: Megger Instruments Limited
    Inventor: David L. Morgan
  • Patent number: D659576
    Type: Grant
    Filed: September 10, 2010
    Date of Patent: May 15, 2012
    Assignee: Megger Instruments Limited
    Inventors: Simon Haynes, Simon Clark