Patents Assigned to MEIWA e-TEC co., ltd.
  • Patent number: 9163992
    Abstract: A technique for an infrared radiation thermometer used for thermography that detects measurement abnormality of an infrared radiation thermometer and estimates the causes of the measurement abnormality such as contamination of an objective lens and a malfunction in a mechanism section of the infrared radiation thermometer.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: October 20, 2015
    Assignees: TOYOTA JIDOSHA KABUSHIKI KAISHA, MEIWA E-TEC CO., LTD.
    Inventors: Yuichi Furukawa, Shingo Nakamura, Yuji Okada, Fumio Kawahara
  • Patent number: 8445847
    Abstract: A technique for an infrared radiation thermometer used for thermography detects measurement abnormality of the infrared radiation thermometer and estimates the causes of the measurement abnormality such as contamination of an objective lens and a malfunction in a mechanism section of the infrared radiation thermometer.
    Type: Grant
    Filed: March 25, 2008
    Date of Patent: May 21, 2013
    Assignees: Toyota Jidosha Kabushiki Kaisha, MEIWA e-TEC co., ltd.
    Inventors: Yuichi Furukawa, Shingo Nakamura, Yuji Okada, Fumio Kawahara
  • Publication number: 20130021601
    Abstract: A technique for an infrared radiation thermometer used for theiniography that detects measurement abnormality of an infrared radiation thermometer and estimates the causes of the measurement abnormality such as contamination of an objective lens and a malfunction in a mechanism section of the infrared radiation thermometer.
    Type: Application
    Filed: August 6, 2012
    Publication date: January 24, 2013
    Applicants: MEIWA E-TEC CO., LTD., TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Yuichi FURUKAWA, Shingo NAKAMURA, Yuji OKADA, Fumio KAWAHARA
  • Patent number: 8340468
    Abstract: Feature points (41, 42, 43) in the heat image (10) of a casting die (1) are extracted and a predetermined geometrical conversion processing is performed on the heat image (10) such that the feature points are superimposed on the reference feature points (61, 62, 63) set in a reference heat image (30) picked up previously to generate a corrected heat image (20). A difference image (40) is generated by superimposing the corrected heat image (20) and the reference heat image (30) such that the corrected feature points (51, 52, 53) in the corrected heat image (20) is superimposed on the corresponding reference feature points (61, 62, 63). With such an arrangement, a highly reliable difference image can be generated even when the imaging field of vision slips off among a plurality of heat images.
    Type: Grant
    Filed: March 25, 2008
    Date of Patent: December 25, 2012
    Assignees: Toyota Jidosha Kabushiki Kaisha, MEIWA e-TEC co., ltd.
    Inventors: Yuichi Furukawa, Shingo Nakamura, Yuji Okada, Fumio Kawahara
  • Publication number: 20100098321
    Abstract: Feature points (41, 42, 43) in the heat image (10) of a casting die (1) are extracted and a predetermined geometrical conversion processing is performed on the heat image (10) such that the feature points are superimposed on the reference feature points (61, 62, 63) set in a reference heat image (30) picked up previously to generate a corrected heat image (20). A difference image (40) is generated by superimposing the corrected heat image (20) and the reference heat image (30) such that the corrected feature points (51, 52, 53) in the corrected heat image (20) is superimposed on the corresponding reference feature points (61, 62, 63). With such an arrangement, a highly reliable difference image can be generated even when the imaging field of vision slips off among a plurality of heat images.
    Type: Application
    Filed: March 25, 2008
    Publication date: April 22, 2010
    Applicants: TOYOTA JIDOSHA KABUSHIKI KAISHA, MEIWA E-TEC CO., LTD.
    Inventors: Yuichi Furukawa, Shingo Nakamura, Yuji Okada, Fumio Kawahara