Abstract: A testable tape for forming electrical innerlead connections between conductive pads, such as in semiconductor die, and a process for manufacturing the testable tape are disclosed. The testable tape includes a plurality of leads arranged in a pattern to form the innerlead bonds to the die. The plurality of leads is supported with a dielectric fill formed selectively on the lead pattern to support and electrically isolate the leads for testing.
Abstract: A semiconductor die bonding machine for the electrical connection of the contact pads of a semiconductor die with the leads of a die holding device, such as a printed circuit board or main leadframe. The bonding machine utilizes micro leadframes formed in an aluminum foil tape and has an alignment mechanism which permits the rapid, mechanized bonding of the contact pads to the leads of the die holding device.