Patents Assigned to Metris IPR NV
  • Patent number: 7268892
    Abstract: The invention concerns a method and a reference object for the verification and identification of a measuring device for measuring the spatial position of one or several points situated in the measuring volume (9) of the measuring device, whereby the measuring device is calibrated, according to which calibration a mathematical model is calculated which makes it possible to determine the spatial position of a point perceived by the measuring device, whereby a reference object (1) with predetermined dimensions is provided in the measuring volume (9), and, next, the position of several points of this reference object (1) is determined by means of the measuring device, whereby the mutual situation of the thus determined position of the points of the reference object (1) is calculated and compared to the actual dimensions of the reference object (1) and, on the basis of the thus established deviations between the measured mutual position of the points of the reference object (1) and the actual dimensions of the re
    Type: Grant
    Filed: April 24, 2002
    Date of Patent: September 11, 2007
    Assignee: Metris IPR NV
    Inventor: Alex Van Den Bossche