Patents Assigned to MetroLaser, Inc.
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Patent number: 11768462Abstract: Embodiments described herein provide an integrated holographic reconstruction platform that enables a user to perform three-dimensional visualization of a phenomenon by reconstructing holograms using a combination of normalization and propagation algorithms, which yields better results with significantly less demanding processing time and computing resources. Specifically, the integrated holographic reconstruction platform may be implemented as an all-in-one computer software that includes software components of digital holographic reconstruction, de-twinning and optical distortion removal via a user-friendly graphical interface.Type: GrantFiled: July 13, 2021Date of Patent: September 26, 2023Assignees: METROLASER, INC., NAVAIR LAKEHURST, NAVAL AIR WARFARE CENTER AD (LKE)Inventors: Mohammad Mansoor, James Trolinger, Jacob George
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Patent number: 11229113Abstract: Described herein are systems and methods for ensuring plasma homogeneity in a discharge cell. The discharge cell may include a first hollow electrode and a second hollow electrode spaced away from the first electrode to define a discharge gap therebetween. A fluid inlet port may in fluid communication with an internal bore of the first electrode. A fluid outlet port may be in fluid communication with the discharge gap. A first pair of viewports may define a first optic pathway through the discharge gap. A second pair of viewports may define a second optic pathway through the discharge gap. A third pair of viewports may define a third optic pathway through the discharge gap, the third optic pathway defined through the hollow interior of the first and second electrodes.Type: GrantFiled: August 12, 2020Date of Patent: January 18, 2022Assignees: MetroLaser, Inc., The Trustees of Princeton UniversityInventors: Andrey Y. Starikovskiy, Jacob George, Richard B. Miles
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Patent number: 9232117Abstract: A Schlieren imaging system can comprise a digital display configured to provide a background for Schlieren imaging, a cutoff filter onto which the background is focused, and a camera configured to image the cutoff filter and the background to facilitate Schlieren imaging. A calibration method for the Schlieren imaging system can comprise forming a pixel image on a digital display, focusing the pixel image on the cutoff filter, imaging the cutoff filter and the pixel image with a camera; and moving the pixel image with respect to the cutoff filter to align the pixel image with respect to the cutoff filter to facilitate Schlieren imaging. Thus, alignment of the Schlieren imaging system can be substantially simplified.Type: GrantFiled: March 12, 2013Date of Patent: January 5, 2016Assignee: MetroLaser, Inc.Inventors: Benjamin D. Buckner, Drew L'Esperance
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Patent number: 8462323Abstract: A sensor system for remote object detection, tracking, characterization, and discrimination can have a plurality of sensors. A shared optical train that can facilitate blending of information from the sensors, so as to provide a single view for the plurality of sensors. Small and/or dim objects can be more readily detected. High-resolution 3 dimensional space object imagery and on-demand target information gathering can be provided with reduced data latency. The undesirable effects of atmospheric turbulence along the aiming direction can be mitigated even when there is a high relative velocity between the surveillance platform and remote target.Type: GrantFiled: March 27, 2008Date of Patent: June 11, 2013Assignee: MetroLaser, Inc.Inventors: Vladimir B. Markov, Anatoliy I. Khizhnyak
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Patent number: 7961332Abstract: A method and system for performing two-dimensional laser Doppler vibrometry (LDV) are disclosed. A high speed fiber optic heterodyne imaging vibrometer can be used for the imaging of high speed surface deformation and/or vibration. Images provided by the high speed fiber optic heterodyne imaging vibrometer can be representative of movement, e.g., displacement or vibration, of the surface being imaged.Type: GrantFiled: June 6, 2008Date of Patent: June 14, 2011Assignee: MetroLaser, Inc.Inventors: James Munro Kilpatrick, Vladimir B. Markov
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Patent number: 7477398Abstract: A multi-beam heterodyne vibrometer for analyzing vibration of an object includes an optical system and a combining element. The optical system generates a plurality of object beams and a plurality of reference beams where one of the plurality of beams has a frequency that is shifted from a frequency of the other plurality of beams. The optical system focuses each of the plurality of object beams on the object and transmits the plurality of focused object beams to the object. A portion of each of the plurality of focused object beams is reflected off of a surface of the object as a modulated object beam. The optical system collects the modulated object beams. The combining element combines each of the modulated object beams with a respective one of the reference beams into a plurality of beam pairs.Type: GrantFiled: August 21, 2006Date of Patent: January 13, 2009Assignee: MetroLaser, Inc.Inventors: Amit K. Lal, Cecil F. Hess, L. Ernesto Hurtado, Vladimir B. Markov, Vyacheslav Aranchuk, Valentina V. Doushkina
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Patent number: 7298497Abstract: Apparatus for splitting, imaging, and measuring wavefronts with a reference wavefront and an object wavefront. A wavefront-combining element receives and combines into a combined wavefront an object wavefront from an object and a reference wavefront. A wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub-wavefronts is substantially contiguous with at least one other sub-wavefront. The wavefront-splitting element may shift the relative phase between the reference wavefront and the object wavefront of the sub-wavefronts to yield a respective plurality of phase-shifted sub-wavefronts. The wavefront-splitting element may then interfering the reference and object wavefronts of the phase-shifted sub-wavefronts to yield a respective plurality of phase-shifted interferograms. An imaging element receives and images the phase-shifted interferograms.Type: GrantFiled: February 7, 2006Date of Patent: November 20, 2007Assignee: MetroLaser, Inc.Inventors: James E. Millerd, Neal J. Brock
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Patent number: 7221445Abstract: A system for quantifying surface characteristics detects and quantifies characteristics of a surface of an object. For example, the system may quantify changes in surface roughness without contacting the specimen and without requiring precise temporal or spatial stability. The system may also quantify the evolution or progression of a particular characteristic of a surface, such as a defect, a slipband, a crack, a microcrack, a pit, a damage feature, corrosion, a contour change, an impact crater, a change in residual stress, and so on. The system may include an energy source, a detector section, and a process section. The energy source transmits a source signal to the surface of the object. The source signal is specularly reflected and/or scattered by the surface to yield one or more received signals. The detector section receives the received signal and, in turn, provides a detector signal indicative of the received signal.Type: GrantFiled: April 12, 2004Date of Patent: May 22, 2007Assignee: MetroLaser, Inc.Inventors: James C. Earthman, Vladimir B. Markov, James D. Trolinger, Derek Dunn-Rankin, Benjamin D. Buckner
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Patent number: 7170611Abstract: Apparatus for splitting, imaging, and measuring wavefronts with a reference wavefront and an object wavefront. A wavefront-combining element receives and combines into a combined wavefront an object wavefront from an object and a reference wavefront. A wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub-wavefronts is substantially contiguous with at least one other sub-wavefront. The wavefront-splitting element may shift the relative phase between the reference wavefront and the object wavefront of the sub-wavefronts to yield a respective plurality of phase-shifted sub-wavefronts. The wavefront-splitting element may then interfering the reference and object wavefronts of the phase-shifted sub-wavefronts to yield a respective plurality of phase-shifted interferograms. An imaging element receives and images the phase-shifted interferograms.Type: GrantFiled: September 21, 2002Date of Patent: January 30, 2007
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Patent number: 6972846Abstract: A multi-beam laser Doppler vibrometer simultaneously measures velocity, displacement, and vibration history of multiple locations on an object. A beam of coherent light is split into an object beam and a reference beam. The object beam is divided into a plurality of object beams to simultaneously illuminate multiple locations on the object under inspection. The reference beam is frequency shifted and split into a corresponding plurality of frequency-shifted reference beams. A portion of each object beam is reflected by the object as a modulated object beam. The plurality of modulated object beams are collected and respectively mixed with the plurality of frequency-shifted reference beams to provide a plurality of beam pairs. Each beam pair may be focused onto a photodetector or an optical fiber connected to a photodetector.Type: GrantFiled: March 31, 2003Date of Patent: December 6, 2005
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Patent number: 6552808Abstract: Apparatus for splitting, imaging, and measuring wavefronts with a reference wavefront and an object wavefront. A wavefront-combining element receives and combines into a combined wavefront an object wavefront from an object and a reference wavefront. A wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub-wavefronts is substantially contiguous with at least one other sub-wavefront. The wavefront-splitting element may shift the relative phase between the reference wavefront and the object wavefront of the sub-wavefronts to yield a respective plurality of phase-shifted sub-wavefronts. The wavefront-splitting element may then interfering the reference and object wavefronts of the phase-shifted sub-wavefronts to yield a respective plurality of phase-shifted interferograms. An imaging element receives and images the phase-shifted interferograms.Type: GrantFiled: July 16, 2001Date of Patent: April 22, 2003
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Patent number: 6304330Abstract: Apparatus for splitting, imaging, and measuring wavefronts with a reference wavefront and an object wavefront. A wavefront-combining element receives and combines into a combined wavefront an object wavefront from an object and a reference wavefront. A wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub-wavefronts is substantially contiguous with at least one other sub-wavefront. The wavefront-splitting element may shift the relative phase between the reference wavefront and the object wavefront of the sub-wavefronts to yield a respective plurality of phase-shifted sub-wavefronts. The wavefront-splitting element may then interfere the reference and object wavefronts of the phase-shifted sub-wavefronts to yield a respective plurality of phase-shifted interferograms. An imaging element receives and images the phase-shifted interferograms.Type: GrantFiled: October 6, 1999Date of Patent: October 16, 2001