Patents Assigned to METROLOGY SOFTWARE PRODUCTS LIMITED
  • Patent number: 10898982
    Abstract: A calibration device for a machine tool is described that includes a base attachable to a machine tool and a calibration artefact, such as a sphere of known radius. A deflection mechanism attaches the calibration artefact to the base and allows movement of the calibration artefact relative to the base when an external force is applied to the calibration artefact. The deflection mechanism also maintains the calibration artefact in a defined rest position relative to the base in the absence of an applied external force. A sensor is provided for sensing the extent of movement of the calibration artefact relative to the base. A method of using the device with a reference tool to accurately determine a position of a calibration artefact is also described.
    Type: Grant
    Filed: January 10, 2017
    Date of Patent: January 26, 2021
    Assignees: RENISHAW PLC, METROLOGY SOFTWARE PRODUCTS LIMITED
    Inventors: Peter Russell Hammond, Christopher Leonard Copper
  • Publication number: 20180369977
    Abstract: A calibration device (30) for a machine tool is described that includes a base (36) attachable to a machine tool and a calibration artefact (32), such as a sphere of known radius. A deflection mechanism attaches the calibration artefact to the base and allows movement of the calibration artefact (32) relative to the base (36) when an external force is applied to the calibration artefact (32). The deflection mechanism also maintains the calibration artefact (32) in a defined rest position relative to the base (36) in the absence of an applied external force. A sensor (46) is provided for sensing the extent of movement of the calibration artefact (32) relative to the base (36). A method of using the device (30) with a reference tool to accurately determine a position of a calibration artefact (32) is also described.
    Type: Application
    Filed: January 10, 2017
    Publication date: December 27, 2018
    Applicants: RENISHAW PLC, METROLOGY SOFTWARE PRODUCTS LIMITED
    Inventor: Peter Russell HAMMOND
  • Patent number: 9541385
    Abstract: An error correction method for coordinate positioning apparatus is described. The method comprises (i) taking a first data set comprising one or more first data values, each first data value describing a position on the surface of a first object, (ii) taking a second data set comprising one or more second data values, each second data value describing a position on the surface of the first object, and (iii) calculating an error map comprising one or more error values, each error value describing a positional difference between the surface as described by the first data set and the surface as described by the second data set. The surface normal of the first object is known at each position described by each first data value and step (iii) comprises calculating each error value by determining the positional difference substantially in the direction of the known surface normal.
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: January 10, 2017
    Assignees: RENISHAW PLC, METROLOGY SOFTWARE PRODUCTS LIMITED
    Inventors: Kevyn Barry Jonas, Geoffrey McFarland, Peter Russell Hammond, Anthony Brown
  • Publication number: 20120323345
    Abstract: An error correction method for coordinate positioning apparatus is described. The method comprises (i) taking a first data set comprising one or more first data values, each first data value describing a position on the surface of a first object, (ii) taking a second data set comprising one or more second data values, each second data value describing a position on the surface of the first object, and (iii) calculating an error map comprising one or more error values, each error value describing a positional difference between the surface as described by the first data set and the surface as described by the second data set. The surface normal of the first object is known at each position described by each first data value and step (iii) comprises calculating each error value by determining the positional difference substantially in the direction of the known surface normal.
    Type: Application
    Filed: March 4, 2011
    Publication date: December 20, 2012
    Applicants: METROLOGY SOFTWARE PRODUCTS LIMITED, RENISHAW PLC
    Inventors: Kevyn Barry Jonas, Geoffrey Mcfarland, Peter Russell Hammond, Anthony Brown