Patents Assigned to Metron Systems, Inc.
  • Patent number: 6940891
    Abstract: This disclosure describes the design and construction of high-precision off-axis optical imaging systems. The disclosure also describes the design and construction of high-precision mounting structures for rigidly holding optical elements in an optical imaging system. The disclosure further describes both a mechanism for highly stable mounting and a technique for high precision focusing of a detector in a complex optical setup. The disclosure even further describes both tooling and a technique used for focusing high precision optical imaging systems. The theory and use of at least these concepts are introduced by examining how these concepts aid the construction and use of a non-contact laser scanning system.
    Type: Grant
    Filed: October 24, 2003
    Date of Patent: September 6, 2005
    Assignee: Metron Systems, Inc.
    Inventors: Thomas R. Clary, Joseph A. Franklin, Kyle S. Johnston, Joseph D. Ridge
  • Patent number: 6870631
    Abstract: A system and method for measuring the profile of an external surface of a part is provided. The system includes a source of light that directs light onto a region of the external surface of the part. The system also includes a linear, light-sensitive sensor, and a lens used to image locations within the region onto the sensor. The source of light and the sensor are located substantially within the same plane such that the sensor detects substantially only light scattered, diffracted, or reflected from the region and travelling substantially within the plane. The system additionally includes a re-positionable mirror that re-directs the light emitted from the source of light to the plurality of locations within the region and re-directs light scattered, diffracted, or reflected from the plurality of locations within the region to the lens and the sensor.
    Type: Grant
    Filed: June 27, 2002
    Date of Patent: March 22, 2005
    Assignees: Metron Systems, Inc., The Boeing Company
    Inventors: Kyle S. Johnston, Tomas E. Lock, Thomas R. Clary, Spencer G. Nelson, Heath M. Greenberg
  • Patent number: 6825922
    Abstract: A system for measuring the external surface profile of a component using a non-contact optical technique which scans the field of view with a spot of light through a range of angles by utilizing a rotating mirror system and which precisely determines the angular position of the spot of light during scanning.
    Type: Grant
    Filed: September 26, 2003
    Date of Patent: November 30, 2004
    Assignee: Metron Systems, Inc.
    Inventors: Kyle S. Johnston, Joseph A. Franklin, Spencer G. Nelson, Charles M. Bass
  • Patent number: 6822748
    Abstract: Calibration techniques are disclosed for determining the rigid-body coordinate transformation that will precisely align the coordinate frame of a laser scanner with the coordinate frames of several different motion axes. The theory and use of at least these concepts are introduced by examining how these concepts aid the construction and use of a non-contact laser scanning system.
    Type: Grant
    Filed: October 29, 2003
    Date of Patent: November 23, 2004
    Assignee: Metron Systems, Inc.
    Inventors: Kyle S. Johnston, Charles M. Bass
  • Patent number: 6785007
    Abstract: A system and method for measuring the profile of an external surface of a part is provided. The system includes a source of light that directs light onto a region of the external surface of the part. The system also includes a linear, light-sensitive sensor, and a lens used to image locations within the region onto the sensor. The source of light and the sensor are located substantially within the same plane such that the sensor detects substantially only light scattered, diffracted, or reflected from the region and travelling substantially within the plane. The system additionally includes a re-positionable mirror that re-directs the light emitted from the source of light to the plurality of locations within the region and re-directs light scattered, diffracted, or reflected from the plurality of locations within the region to the lens and the sensor.
    Type: Grant
    Filed: June 27, 2002
    Date of Patent: August 31, 2004
    Assignees: Metron Systems, Inc., The Boeing Company
    Inventors: Kyle S. Johnston, Tomas E. Lock, Thomas R. Clary, Spencer G. Nelson, Heath M. Greenberg
  • Patent number: 6441908
    Abstract: A system and method for measuring the profile of an external surface of a part is provided. The system includes a source of light that directs light onto a region of the external surface of the part. The system also includes a linear, light-sensitive sensor, and a lens used to image locations within the region onto the sensor. The source of light and the sensor are located substantially within the same plane such that the sensor detects substantially only light scattered, diffracted, or reflected from the region and travelling substantially within the plane. The system additionally includes a re-positionable mirror that re-directs the light emitted from the source of light to the plurality of locations within the region and re-directs light scattered, diffracted, or reflected from the plurality of locations within the region to the lens and the sensor.
    Type: Grant
    Filed: August 3, 2000
    Date of Patent: August 27, 2002
    Assignees: Metron Systems, Inc., The Boeing Company
    Inventors: Kyle S. Johnston, Tomas E. Lock, Thomas R. Clary, Spencer G. Nelson, Heath M. Greenberg