Patents Assigned to Micro-Computer Engineering Corporation
  • Patent number: 4587638
    Abstract: In the semiconductor memory device according to the present invention, when there is a defective portion in the memory cells, those memory cells are replaced by redundant memory cells. When defective portions are discovered in the memory cells, the fuse elements corresponding to the memory cells having the defective portions are cut off. Voltages of the select lines connected to the memory cells having the defective portions are held at an L level by the resistors. Due to this, the memory cells having the defective portions are not selected.
    Type: Grant
    Filed: July 12, 1984
    Date of Patent: May 6, 1986
    Assignee: Micro-Computer Engineering Corporation
    Inventors: Mitsuo Isobe, Takayasu Sakurai, Kazuhiro Sawada, Tetsuya Iizuka, Takayuki Ohtani, Akira Aono