Abstract: An apparatus for testing an electrical device, having a high side terminal and a low side terminal, includes a power source which is connected to the high side terminal. A voltage monitor is also connected to the high side terminal to determine the voltage that is input to the device. Additionally, a current monitor is connected to the low side terminal to determine the current that passes through the device. A processor is connected to the power source, to the voltage monitor, and to the current monitor. Using the voltage input to high side terminal, and the through current from the low side terminal, the processor computes algorithmic functions which are compared with a predetermined value to establish an error signal. The apparatus then uses this error signal to control the input voltage from the power source to the high side terminal of the device.

Abstract: An apparatus for testing an electrical device, having a high side terminal and a low side terminal, includes a power source which is connected to the high side terminal. A voltage monitor is also connected to the high side terminal to determine the voltage that is input to the device. Additionally, a current monitor is connected to the low side terminal to determine the current that passes through the device. A processor is connected to the power source, to the voltage monitor, and to the current monitor. Using the voltage input to high side terminal, and the through current from the low side terminal, the processor computes algorithmic functions which are compared with a predetermined value to establish an error signal. The apparatus then uses this error signal to control the input voltage from the power source to the high side terminal of the device.

Abstract: An apparatus for connecting an electronic device located in a high temperature environment, with a test unit located in a lower temperature environment, includes a ceramic fixturing plate that is formed with at least one hole. The apparatus also includes a metal spring conductor clip which has a first end and a second end. The first end of the conductor clip is selectively insertable into a hole of the fixturing plate to establish electrical contact with a lead from the electronic device being tested. At the same time, the second end of the conductor clip is engageable with the fixturing plate to hold the conductor clip on the plate. A wire, which is mechanically and electrically connected to the conductor clip, electrically connects the electronic device with the test unit that is located in the lower temperature environment.