Abstract: Provided is a spatial phase shifting interferometer using a multi wavelength. More particularly, provided is a spatial phase shifting interferometer using a multi wavelength capable of more rapidly measuring a precise shape of a measurement object by simultaneously oscillating laser having different wavelengths and passing the oscillated laser through a beam splitter and a lens to analyze an interference fringe of the measurement object.
Type:
Grant
Filed:
November 2, 2012
Date of Patent:
April 28, 2015
Assignees:
Korea Research Institute of Standards and Science, Micro Motion Technology Co., Ltd.
Inventors:
Jae Wan Kim, Jong Ahn Kim, Dong-Won Lee