Patents Assigned to Microchemistry Ltd.
  • Patent number: 6630030
    Abstract: A method and an apparatus for producing a thin film on a substrate. A substrate is placed in a reaction space and is subjected to alternately repeated surface reactions with at least two different reactants. The reactants are fed in the vapor phase repeatedly and alternately into the reaction space through tree-like piping having a plurality of channels and nozzle orifices, where the nozzle orifices are arranged in a plane perpendicular to the plane of the substrate. The apparatus includes a reaction chamber in which the substrate is placed, inflow piping having a plurality of channels and nozzle orifices, and outlet passages for removing the reaction products and excess reactants. The inflow piping has a tree-like shape and is contained in a plurality of interconnected plates. The nozzle orifices are arranged in an essentially planar fashion in a plane essentially perpendicular to the plane of the substrate.
    Type: Grant
    Filed: January 4, 2000
    Date of Patent: October 7, 2003
    Assignee: ASM Microchemistry Ltd.
    Inventors: Tuomo Suntola, Pekka Soininen, Niklas Bondestam
  • Patent number: 6416577
    Abstract: This invention concerns a method for coating the inner surfaces of equipment with a layer of material. According to the invention, of the inner space of the equipment limited by the surfaces to be coated is at least partly closed, to said inner space pulses of at least two different reagents in gaseous phase are fed alternately and repeatedly and a layer of material is grown on the surfaces of the inner space according to ALE-technique by exposing the surfaces to the alternating surface reactions of the reagents. With the aid of the invention it is possible to coat pipes and tanks of desired size without using a separate growing equipment.
    Type: Grant
    Filed: June 7, 2000
    Date of Patent: July 9, 2002
    Assignee: ASM Microchemistry Ltd.
    Inventors: Tuomo Suntoloa, Markku Leskelä, Mikko Ritala
  • Patent number: 5945839
    Abstract: The method and apparatus for measuring the current-voltage characteristic curve of a solar panel uses cost-effective equipment and a minimized need of optical output power. A light pulse is applied to the solar panel and the response of the solar panel to the light pulse is measured by varying the electrical load connected to the output of the solar panel. The measurement is carried out with the help of a short-duration decaying light pulse such that the falling tail of the pulse is used for such a short period that the intensity of the pulse does not have time to change essentially during the measurement.
    Type: Grant
    Filed: March 20, 1997
    Date of Patent: August 31, 1999
    Assignee: Microchemistry Ltd.
    Inventor: Jaakko Hyvarinen