Abstract: A method for manufacturing an electronic device such as an integrated circuit or display device is provided. A design description of the electronic device is generated using a computer aided design tool. Physical device data representing a physical description of the electronic device are electronically determined based on the design description. The physical device data includes data defining connection points for connecting the electronic device to external circuits and data identifying a plurality of connection points of the electronic device. A physical embodiment of the electronic device is produced in accordance with the physical device data. Physical test member data representing conductors and contact points of a test member for testing the electronic device are electronically determined. The test member is produced in accordance with the test member data and used to test the electronic device.

Abstract: A method, apparatus or stored program for adjusting the clock throttle rate of a central processing unit (CPU) included in a computer, in which the usage of the CPU is measured, so that the clock throttle rate of the CPU can be automatically adjusted on the measured usage of the CPU, thereby reducing the consumption of electric power without any influence on the performance of the computer.

Abstract: The present invention relates to a method for measuring a quantity of usage of a CPU, in particular to a method for measuring a quantity of usage of a CPU which is capable of getting a credible quantity of usage of a CPU without amending an algorithm in order to adapt it to the an operating system, e.g., MS-Windows System, or requiring a complicated code. The method uses various algorithms provided by the operating system on the behalf of a registry storing a quantity of usage of a CPU inside a system. Accordingly the present invention can measure a quantity of usage of a CPU easily without lowering a performance of the operating system.

Abstract: A method for manufacturing an electronic device such as an integrated circuit or display device is provided. A design description of the electronic device is generated using a computer aided design tool. Physical device data representing a physical description of the electronic device are electronically determined baded on the design description. The physical device data includes data defining connection points for connecting the electronic device to external circuits and data indentifying a plurality of connection points of the electronic device. A physical embodiment of the electronic device is produced in accordance with the physical device data. Physical test member data representing conductors and contact points of a test member for testing the electronic device are electronically determined. The test member is produced in accordance with the test member data and used to test the electronic device.

Abstract: Improved contact devices and methods for producing contact devices and using such contact devices to produce electronic devices are disclosed. A contact device having a plurality of nominally coplanar first contact elements makes electrical contact with corresponding nominally coplanar second contact elements of an electronic device such an integrated circuit or liquid crystal or other display when the contact device and the electronic device are positioned so that the plane of the first contact elements is substantially parallel to the plane of the second contact elements and relative displacement of the devices is effected in a direction substantially perpendicular to the plane of the first contact elements and the plane of the second contact elements.