Abstract: The invention is a modified organic photoresist which is resistant to etching in oxygen-containing plasmas and therefore particularly useful for masking and etching organic polymer materials in VLSI and advanced packaging applications. The invention comprises adding a phosphorous-containing compound to a conventional photoresist. The phosphorous-containing compound is of a type and in an amount effective to substantially prevent etching of the modified photoresist in an oxygen-containing plasma without substantially adversely affecting the photosensitivity of the photoresist or the elasticity or the adhesion of the etch resistant film formed during oxygen-containing plasma exposure to an underlying material to be patterned and etched.
Type:
Grant
Filed:
September 20, 1990
Date of Patent:
May 19, 1992
Assignees:
Microelectronics Center of N.C., University of North Carolina at Charlotte
Inventors:
Farid M. Tranjan, Thomas D. DuBois, Rudolf G. Frieser, Stephen M. Bobbio, Susan K. S. Jones
Abstract: A method and apparatus for rasterizing a two-dimensional fast Fourier transform of a size N.times.N using a pipelined butterfly computational unit with 2logN processors. The invention avoids the problems associated with transposing the matrix so that the data can be continuously driven into the arithmetic processors in a pipelined fashion. It is devised for realtime applications using raster scan or serial input and output devices.
Type:
Grant
Filed:
November 3, 1986
Date of Patent:
April 11, 1989
Assignees:
Microelectronics Center of N.C., N.C. State University
Inventors:
Wentai Liu, William T. Krakow, Thomas A. Hughes, Jr.