Patents Assigned to MICROFRIEND CO., LTD.
  • Probe including an alignment key protruded from a side of an alignment beam and a probe card including the same
    Patent number: 11061052
    Abstract: A probe includes a probe body for providing an object with a test signal; a tip arranged on an end of the probe body to make contact with the object; and an alignment key protruded from a side of the probe body.
    Type: Grant
    Filed: March 28, 2019
    Date of Patent: July 13, 2021
    Assignees: SAMSUNG ELECTRONICS CO., LTD., MICROFRIEND CO., LTD.
    Inventors: Sung-Hoon Lee, Byoung-Joo Kim, Mi-Rye Lee, Hwang-Jin Yeo, Tae-Jong Lee