Abstract: A system includes a memory component and a processing device, operatively coupled with the memory component, to send a read command to the memory component while a program or erase operation being executed by the memory component is suspended. The processing device, operatively coupled with the memory component, can then send an auto resume command to the memory component to automatically resume execution of the program or erase operation after the read command is executed.

Abstract: A solid state drive having a drive aggregator configured with multiple host interfaces for parallel and/or redundant connections to one or more host systems. The solid state drive has a plurality of component solid state drives connected to the drive aggregator. Each of the component solid state drives has a controller capable of processing commands from host systems. The drive aggregator is configured to receive commands in the host interfaces concurrently and implement the commands received from the host system using the plurality of component solid state drives.

Abstract: Methods, systems, and devices for degradation signaling for a memory device are described. In one example, a method in accordance with the described techniques may include monitoring, at a memory device, an operational characteristic of the memory device. For example, the threshold voltage of one or more transistors within the memory device may be monitored. The memory device may identify a degradation of the memory device based at least in part on the monitored operational characteristic. Based on identifying the degradation, the memory device may signal, to a host device, an indication of the degradation of the memory device.

Abstract: A semiconductor device includes a semiconductor substrate; and a multilevel wiring structure on the semiconductor substrate, the multilevel wiring structure including at least an intermediate metal layer over the semiconductor substrate and an uppermost metal layer over the intermediate metal layer, and the multilevel wiring structure being divided into a main circuit portion and a scribe portion surrounding the main circuit portion; wherein the scribe portion of the multilevel wiring layer includes at least a metal pad exposed in the intermediate metal layer.

Abstract: A current operating characteristic value of a unit of the memory device is identified. An operating characteristic threshold value is identified from a set of operating characteristic thresholds, where the current operating characteristic value satisfies an operating characteristic threshold criterion that is based on the operating characteristic threshold value. A set of write-to-read (W2R) delay time thresholds that corresponds to the operating characteristic threshold value is identified from a plurality of sets of W2R delay time thresholds. Each of the W2R delay time thresholds in the set is associated with a corresponding read voltage level. A W2R delay time threshold associated with a W2R delay time threshold criterion is identified from the set of W2R delay time thresholds, where the W2R threshold criterion is satisfied by a current W2R delay time of the memory sub-system. A read voltage level associated with the identified W2R delay time threshold is identified.

Abstract: Methods, systems, and devices for reduced pin status register are described. An apparatus may include a first memory die and a second memory die each coupled with a data bus. The apparatus may further include a controller coupled with the first memory die and the second memory die via the data bus that is configured to transmit a first command associated with a first operation to the first memory die and a second command associated with a second operation to the second memory die. The controller may further transmit a third command concurrently to the first memory die and the second memory die, the third command requesting a first status of the first operation and a second status of the second operation. The controller may receive the first status and the second status concurrently via the data bus from the first memory die and the second memory die.

Abstract: A memory device including memory cells operating according to a first clock signal having a first clock frequency and accessed based on a data access time. The memory device may include a clock shifter circuit for delaying the access commands based on the data access time. The clock shifter circuitry include a shift register circuit and a phase correction circuit. The shift register circuit delays the access commands using a second clock signal having a fraction of the first clock frequency. The phase correction circuit receives the access commands from the shift register circuitry using the fraction of the first clock frequency, delays the access commands based on phase information of the access commands, and outputs the access commands to the memory cells based on the data access time using the first clock frequency.

Abstract: Methods and devices related to selecting image sensors are described. In an example, a method can include receiving, at a processing resource of a computing device, first signaling indicative of image data from a plurality of image sensors that are located under a surface of a display of the computing device; receiving, at the processing resource of the computing device, second signaling indicative of display data indicating a first portion of the display is active when the computing device is running an application, determining, at the processing resource, that a first image sensor of the plurality of sensors is closest to the first portion of the display, and selecting the first image sensor of the plurality of sensors closest to the first portion of the display for generating image data for the application.

Abstract: A computer system having a host in communication with a data storage device is coupled to the host via a peripheral bus and a host interface. The data storage device has a controller, non-volatile storage media; and firmware containing instructions configures the operations of the controller. The host transmits a sequence of commands to the storage device to read data items from, or write data items to, the non-volatile storage media. The storage device examines a subset of the commands to determine whether or not data items identified in the subset are addressed sequentially and optimizes processing of at least a portion of the sequence of commands based on a result of a determination of whether or not data items identified in the subset are addressed sequentially.

Abstract: A memory sub-system configured to iterative calibrate read voltages, where higher read voltages are calibrated based on the calibration results of lower read voltages. For example, a memory device initially determines first read voltages of a group of memory cells. The memory device calculates a second read voltage optimized to read the group of memory cells according to first signal and noise characteristics measured based on at least one of the first read voltages. A third read voltage is estimated based on an offset of the second read voltage from a corresponding voltage among the first read voltages. Second signal and noise characteristics of the group of memory cells are measured based on the third read voltage. The memory device then calculates a fourth read voltage optimized to read the group of memory cells according to the second signal and noise characteristics.

Abstract: Methods, systems, and devices for advanced power off notification for managed memory are described. An apparatus may include a memory array comprising a plurality of memory cells and a controller coupled with the memory array. The controller may be configured to receive a notification indicating a transition from a first state of the memory array to a second state of the memory array. The notification may include a value, the value comprising a plurality of bits and corresponding to a minimum duration remaining until a power supply of the memory array is deactivated. The controller may also execute a plurality of operations according to an order determined based at least in part on a parameter associated with the memory array and receiving the notification comprising the value.

Abstract: Methods, systems, and devices for feedback for power management of a memory die using shorting are described. A memory device may short a first rail with a voltage source for communicating feedback regarding a supply voltage to a power management component, such as a power management integrated circuit of a memory system. The memory device may detect a condition of one or more voltage rails for delivering power coupled with the array of memory cells. The memory device may short a first rail of the network of components for delivering power with a voltage source based on detecting the condition. In some cases, the memory device may generate a feedback signal across the first rail of the network of components for delivering power based on shorting the first rail.

Abstract: The present disclosure includes apparatuses and methods related to performing background operations in memory. A memory device can be configured to perform background operations while another memory device in a memory system and/or on a common memory module is busy performing commands received from a host coupled to the memory system and/or common memory module. An example apparatus can include a first memory device, wherein the first memory device can include an array of memory cells and a controller configured to perform a background operation on the first memory device in response to detecting a command from a host to a second memory device.

Abstract: Various embodiments enable read buffering in connection with data block transfer on a memory device. For some embodiments, read buffering from a set of cache blocks is enabled during a period of wait time after data is copied (e.g., data is transferred, such as part of a compaction operation) from the set of cache blocks to a set of non-cache blocks. In various embodiments, after the wait time, data stored on the set of cache blocks is erased (e.g., the set of cache blocks is released) and read buffering from the set of cache blocks is disabled.

Abstract: A three-dimensional stacked integrated circuit (3D SIC) having a non-volatile memory die having an array of non-volatile memory partitions, a volatile memory die having an array of volatile memory partitions, and a processing logic die having an array of processing logic partitions. The non-volatile memory die, the volatile memory die, and the processing logic die are stacked. The non-volatile memory die, the volatile memory die, and the processing logic die can be arranged to form an array of functional blocks, and at least two functional blocks can each include a different data processing function that reduces the computation load of a controller.

Abstract: Methods, systems, and apparatuses related to runtime selection of memory devices and storage devices in a disaggregated memory system are described. For example, a controller can be coupled to a plurality of memory device and a plurality of storage devices. The controller can receive signaling indicative of a memory request corresponding to execution of an application. Responsive to receiving the signaling indicative of the memory request, the controller can select a memory device or a storage device, or both, selecting from the plurality of memory devices or the plurality of storage devices, or both, to perform a memory operation associated with the memory request. Responsive to receiving the memory request and selecting the memory device or the storage device, or both, the controller can perform the memory operation using the selected memory device or the selected storage device, or both.

Abstract: A zone is loaded onto a first memory component of a storage system, wherein the zone comprises one or more regions of data blocks comprising a first plurality of logical block addresses (LBAs), and a snapshot of each of the one or more regions is stored on a second memory component of the storage system and is associated with a version identifier. A particular version identifier associated with a respective snapshot of a region is identified, and a set of journals stored on the second memory component are identified, wherein the set of journals comprise a second plurality of LBAs mapped to a second plurality of physical block addresses.

Abstract: Methods, apparatuses, and systems associated with inventory management are described. Examples can include receiving at a processor first signaling from a first sensor device configured to monitor the interior of a first enclosure and receiving at the processor second signaling from a second sensor device configured to monitor the interior of a second enclosure. Examples can include writing from the processor to a storage device coupled to the processor data that is based at least in part on a combination of the first and second signaling, identifying a quantity or amount of at least one item in the first enclosure and at least one item in the second enclosure, and transmitting third signaling when the quantity or amount of the at least one item in the first enclosure or the at least one item in the second enclosure is less than a threshold value.

Abstract: A method used in forming an array of memory cells comprises forming a vertical stack comprising transistor material directly above insulator material. A mask is used to subtractively etch both the transistor material and thereafter the insulator material to form a plurality of pillars that individually comprise the transistor material and the insulator material. The insulator material is laterally-recessed from opposing lateral sides of individual of the pillars selectively relative to the transistor material of the individual pillars. The individual pillars are formed to comprise a first capacitor electrode that is in void space formed from the laterally recessing. Capacitors are formed that individually comprise the first capacitor electrode of the individual pillars. A capacitor insulator is aside the first capacitor electrode of the individual pillars and a second capacitor electrode is laterally-outward of the capacitor insulator.

Abstract: A highly read data manager of a memory device receives a request to perform receives a request to perform a data relocation operation on a first wordline of a plurality of wordlines for a memory device, the memory device comprising a plurality of multi-level memory cells, wherein each multi-level memory cell comprises a plurality of pages; determines at the first wordline comprises data stored at one or more high read disturb pages of the plurality of pages; determines whether the data comprises a characteristic that satisfies a threshold criterion in relation to additional data stored on additional wordlines of the plurality of wordlines; responsive to determining that the data comprises the characteristic that satisfies the threshold criterion, identifies one or more low read disturb pages of the plurality of pages of a target wordline for relocating the data; and responsive to identifying the one or more low read disturb pages of the target wordline, stores at least a portion of the data at the one or more