Abstract: Identifying false test alarms to a developer. A code build is executed in a test system that includes computing functionality and computing infrastructure that is able to execute the build. Executing the code build includes running a plurality of system and integration tests on the code build. As a result of executing the code build, a system and integration test failure is identified. One or more characteristics of the system and integration test failure are identified. The characteristics of the system and integration test failure are compared to characteristics of a set of historical previous known false test alarms. False test alarms are failures caused by a factor other than a factor for which a test is being run. Based on the act of comparing, information is provided to a developer with respect to if the system and integration test failure is potentially a false test alarm.
Type:
Grant
Filed:
September 4, 2015
Date of Patent:
July 18, 2017
Assignee:
Micron Technology Licensing, LLC
Inventors:
Kim Sebastian Herzig, Nachiappan Nagappan
Abstract: An organic EL display comprising a substrate having an EL region, an anode on the EL region of the substrate, a supplementary electrode coupled to a portion of the anode, an organic EL layer on the EL region, and a cathode on the organic EL layer. The supplementary electrode is located at the EL region.