Abstract: A burn-in station (BIS) for performing burn-in testing of electronic devices, comprising: a main frame; a plurality of burn-in drivers (BIDs) embedded in the main frame and each including a plurality of slots; wherein each of the slots receives a burn-in board (BIB) meant to accommodate a plurality of devices to be tested; wherein each of the slots comprises a slot cover which, in an operative condition, tops the BIB to define a slot chamber enclosing the devices to be tested: wherein the slot cover comprises heating means meant to heat the underlying slot chamber.

Abstract: A contact probe comprising a first end having a first contact tip adapted to contact an electronic component under test, a second end having a second contact tip adapted to contact a probe card, and a central body which extends between the first end and the second end, a cross-sectional area at the central body being smaller than a cross-sectional area at the first end and a cross-sectional area at the second end.

Abstract: A method for manufacturing a metal structure designed to put a plurality of electronic devices in electric contact, the method including the steps of: arranging a planar lower support; depositing a first photoresist layer on the lower support; etching the first photoresist layer so as to form at least one first through opening in the first photoresist layer; filling the at least one first through opening with a conductive material so as to form at least one first conductive segment, which develops along a growth direction; depositing a first metallic primary layer on the first photoresist layer; repeating the previous steps to form other conductive segments in line with the first one to define the metal structure; and a step of removing the photoresist layers and the metallic primary layers so as to release the metal structure.

Abstract: A method for manufacturing an interface element arranged to put a plurality of terminations of a device to be tested in contact with the corresponding channels of a testing head, the method including the steps of: arranging a planar lower support; depositing a first photoresist layer on the lower support; etching the first photoresist layer so as to form a plurality of through openings in the first photoresist layer; filling the plurality of through openings with a conductive material so as to form at least one conductive segment; repeating the above steps up to reach a desired thickness, where the conductive segments which are contiguous to each other define a plurality of conductors; removing the photoresist layers; and embedding the plurality of conductors in an elastomeric matrix.

Abstract: The present invention relates to a burn-in station (BIS) for performing burn-in testing of electronic devices, comprising: a main frame; a plurality of burn-in drivers (BIDs) embedded the main frame and each including a plurality of slots; and a controller connected to each of the plurality of slots through a corresponding driver, and configured to generate command signals and analyze test results, wherein each of the plurality of slots is configured to receive a burn-in board (BIB), which is connectable to the driver provided in a same slot and configured to receive a device for testing, wherein the BIB is received in a slot case and is separated from the driver by the slot case.

Abstract: A a testing head with vertical probes for a probe card, including: at least one pair of support and guide plates arranged parallel to each other in a prefixed spaced apart relation and provided with a plurality of guide and housing holes; a plurality of contact probes housed and extended between corresponding holes of the guide plates; at least one additional plate slidingly mounted next to one or the other of the guide plates and provided with one corresponding plurality of holes of the guide plates. The embodiments also relate to a method of assembly of the testing head.

Abstract: A switching device including at least one first terminal and at least one second terminal, at least one actuation unit including an electrovalve and an actuator which is integral with a contact plate which is able to move from a first position, in which it is in contact with both the at least one first terminal and the at least one second terminal thereby bringing them into electrical contact, to a second end stroke position, in which it is offset from the at least one first terminal and at least one second terminal, where the electrovalve is arranged to command the actuator, thereby moving the contact plate between the first end stroke position and the second end stroke position, the at least one first terminal and at least one second terminal including retractable electrical contacts which are retractable within a respective housing against the action of an elastic element.

Abstract: The present disclosure relates to a method and system of developing and executing a test program for verifying a device under test (DUT).

Abstract: An interface element arranged to put a plurality of terminations of a device to be tested in contact with corresponding channels of a testing head, including at least one elastomeric matrix and a plurality of conductors embedded in the elastomeric matrix; the interface element having an upper face and a lower face which are substantially parallel and spaced apart by a thickness measured along a vertical direction; the conductors are separated from each other and pass through the whole thickness of the interface element from the upper face to the lower face, the conductors have at least one portion which is not parallel to the vertical direction.